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Atomic Data for Lighting Applications

Published

Author(s)

Gillian Nave, Craig J. Sansonetti, Joseph Reader

Abstract

A major objective of our research program is the observation of spectra of rare earth elements in support of our program of atomic data measurements for lighting applications. Three years ago, NIST acquired a high-resolution Fourier transform spectrometer from the Los Alamos National Laboratory. The instrument has an unapodized spectral resolution of 0.0025 cm-1 and currently has a wavelength range of 250 nm to 5.5um. Our FTS is being used to measure accurate wavelengths and branching fractions of rare earth elements. These are needed for accurate line identifications and for computer modeling of lighting discharges. In addition to describing our program of atomic data measurements for lighting applications, we will present initial measurements of dysprosium branching fractions in hollow cathode lamps and single isotope microwave discharge lamps.
Citation
Special Publication (NIST SP) -

Keywords

atomic data, rare earth elements

Citation

Nave, G. , Sansonetti, C. and Reader, J. (2008), Atomic Data for Lighting Applications, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed July 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 16, 2008