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An Approach to T-way Test Sequence Generation With Constraints

Published

Author(s)

Raghu N. Kacker, David R. Kuhn

Abstract

In this paper we address the problem of constraint handling in t-way test sequence generation. We develop a notation for specifying sequencing constraints and present a t-way test sequence generation that handles the constraints specified in this notation. We report a case study in which we applied our notation and test generation algorithm to a real-life communication protocol. Our experience indicates that our notation is intuitive to use and allows us to express important sequencing constraints for the protocol. However, the test generation algorithm takes a significant amount of time. This work is part of our larger effort to make t- way sequence testing practically useful.
Proceedings Title
Proceedings of IEEE International Conference on Software Testing, Verification and Validation
ICST 2019 Workshops
Conference Dates
April 22-27, 2019
Conference Location
Xian
Conference Title
IEEE International Conference on Software Testing, Verification and Validation
ICST 2019

Keywords

Test Sequence Generation, Sequencing Constraint, T-way Sequence Coverage, Sequence Testing, Event-based Testing, Combinatorial Testing

Citation

Kacker, R. and Kuhn, D. (2019), An Approach to T-way Test Sequence Generation With Constraints, Proceedings of IEEE International Conference on Software Testing, Verification and Validation ICST 2019 Workshops, Xian, -1, [online], https://doi.org/10.1109/ICSTW.2019.00059. (Accessed November 29, 2022)
Created April 21, 2019, Updated September 18, 2020