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Anisotropic resonant x-ray diffraction of a conjugated polymer at the sulfur K-edge

Published

Author(s)

Eliot Gann, Christopher McNeill, Guillaume Freychet

Abstract

The planar, aromatic nature of the backbone of conjugated polymers endow them with anisotropic properties. Here we show that the resonant x-ray diffraction of a sulfur containing semicrystalline conjugated polymer at the sulfur K-edge is highly anisotropic, with strong modulation of diffracted intensity depending upon the relative orientation of the polarization of the incident beam with respect to the diffracting crystal planes. Through determination of the anisotropic resonant scattering factors, we are able to spectroscopically reproduce the observed resonant anisotropic scattering effects based on a proposed unit cell geometry for the polymer.
Citation
Journal of Physical Chemistry Letters

Keywords

diffraction, resonant diffraction

Citation

Gann, E. , McNeill, C. and Freychet, G. (2021), Anisotropic resonant x-ray diffraction of a conjugated polymer at the sulfur K-edge, Journal of Physical Chemistry Letters, [online], https://doi.org/10.1021/acs.jpclett.1c00532 (Accessed June 13, 2024)

Issues

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Created April 12, 2021, Updated October 14, 2022