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Angle-dependent infrared reflectance measurements in support of VIIRS



Simon G. Kaplan, Leonard M. Hanssen, Enrique J. Iglesias


We have developed a goniometric reflectometer using a Fourier-transform infrared (FTIR) spectrometer source for polarized reflectance measurements from 1 um to 20 um wavelength at angles of incidence from 10° to 80°, with an incident beam geometry of approximately f/25. Measurements are performed in either absolute mode, or relative to a reference mirror that has been calibrated at near-normal incidence using an integrating sphere-based reflectometer. Uncertainties in the 0.2 % to 0.5 % range are achieved using a photoconductive 77 K InSb detector from 1 um to 5 um and a 12 K Si:As BIB detector from 2 um to 20 um. The performance of the system has been tested using dielectric materials such as Si as well as high-quality Au mirrors. We describe measurements of SiOx-coated Ag mirrors similar to the half-angle mirror (HAM) used in the VIIRS optical scanning system. Various coatings are analyzed to help assess the effect of p-polarized absorption bands at angles from 10° to 65° and wavelengths between 3 um and 13 um.
Proceedings Title
SPIE Infrared Spaceborne Remote Sensing and Instrumentation XVI
Conference Dates
August 10-14, 2008
Conference Location
San Diego, CA


infrared, optical coatings, polarization, radiometry, reflectance


Kaplan, S. , Hanssen, L. and Iglesias, E. (2008), Angle-dependent infrared reflectance measurements in support of VIIRS, SPIE Infrared Spaceborne Remote Sensing and Instrumentation XVI, San Diego, CA (Accessed June 12, 2024)


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Created August 14, 2008, Updated February 19, 2017