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Analytic determination of optimal projector lens design requirements for pixilated projectors used to test pixilated imaging sensors



Joseph P. Rice


A model is described for the problem of optimally projecting a pixellated light source onto a pixellated imaging sensor, in the context that the projected source is used for performance testing of the sensor. The model can be used, for example, to compute the paraxial design requirements of the projection lens, given that the parameters of all other subsystems in the problem are fixed. For remote sensing applications, where the performance of a sensor focused at infinity is to be tested, the projector lens becomes a collimator. For optimal projection when using the source for performance testing of the sensor, one then requires that the projector pixels are not spatially resolved by the imaging sensor, the entrance pupil of the sensor is overfilled without vignetting, and also, where feasible, the sensor field of view is overfilled. The model uses paraxial analytical ray tracing approximations to provide a set of nist-equations that are used in an associated spreadsheet to determine the basic collimator requirements such as effective focal length, f/#, and relief distance, given the geometrical characteristics of the projector spatial light modulator and the sensor under test. Beyond this, the model provides a sense of intuition and guidance prior to detailed computerized ray tracing.
Proceedings Title
Proceedings of SPIE
Conference Dates
April 29-May 3, 2013
Conference Location
Baltimore, MD
Conference Title
Conference on Technologies for Synthetic Environments: Hardware-in-the-Loop XVIII


imaging, projector, testing, optics, lens design, hardware-in-the-loop
Created July 25, 2013, Updated November 10, 2018