Jason P. Killgore, Christopher C. Glover, Ryan Tung
This work presents data confirming the existence of a scan speed related phenomenon in contact mode atomic force microscopy. Specifically, contact resonance spectroscopy is used to interrogate this phenomenon. A monotonic decrease in the recorded contact resonance frequencies is observed with increasing scan speed. A squeeze film hydrodynamic theory is proposed to explain this phenomenon.
, Glover, C.
and Tung, R.
AFM Scan Speed Phenomena, Beilstein Journal of Nanotechnology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923735
(Accessed December 11, 2023)