Killgore, J.
, Glover, C.
and Tung, R.
(2018),
AFM Scan Speed Phenomena, Beilstein Journal of Nanotechnology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923735
(Accessed December 11, 2023)
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AFM Scan Speed Phenomena
Published
Author(s)
, Christopher C. Glover, Ryan Tung
Abstract
This work presents data confirming the existence of a scan speed related phenomenon in contact mode atomic force microscopy. Specifically, contact resonance spectroscopy is used to interrogate this phenomenon. A monotonic decrease in the recorded contact resonance frequencies is observed with increasing scan speed. A squeeze film hydrodynamic theory is proposed to explain this phenomenon.Citation
Beilstein Journal of Nanotechnology
Pub Type
Journals
Download Paper
Keywords
Atomic Force Microscopy, Tribology, Contact Mechanics, Hydrodynamics
Citation
Created March 21, 2018, Updated April 6, 2018