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AFM Scan Speed Phenomena

Published

Author(s)

Jason P. Killgore, Christopher C. Glover, Ryan Tung

Abstract

This work presents data confirming the existence of a scan speed related phenomenon in contact mode atomic force microscopy. Specifically, contact resonance spectroscopy is used to interrogate this phenomenon. A monotonic decrease in the recorded contact resonance frequencies is observed with increasing scan speed. A squeeze film hydrodynamic theory is proposed to explain this phenomenon.
Citation
Beilstein Journal of Nanotechnology

Keywords

Atomic Force Microscopy, Tribology, Contact Mechanics, Hydrodynamics

Citation

Killgore, J. , Glover, C. and Tung, R. (2018), AFM Scan Speed Phenomena, Beilstein Journal of Nanotechnology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923735 (Accessed June 15, 2024)

Issues

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Created March 21, 2018, Updated April 6, 2018