Killgore, J.
, Glover, C.
and Tung, R.
(2018),
AFM Scan Speed Phenomena, Beilstein Journal of Nanotechnology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923735
(Accessed May 11, 2025)
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AFM Scan Speed Phenomena
Published
Author(s)
, Christopher C. Glover, Ryan Tung
Abstract
This work presents data confirming the existence of a scan speed related phenomenon in contact mode atomic force microscopy. Specifically, contact resonance spectroscopy is used to interrogate this phenomenon. A monotonic decrease in the recorded contact resonance frequencies is observed with increasing scan speed. A squeeze film hydrodynamic theory is proposed to explain this phenomenon.Citation
Beilstein Journal of Nanotechnology
Pub Type
Journals
Download Paper
Keywords
Atomic Force Microscopy, Tribology, Contact Mechanics, Hydrodynamics
Citation
Issues
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Created March 21, 2018, Updated April 6, 2018