Schwarze, T.
, Gerberding, O.
, Guzman, F.
, Heinzel, G.
and Danzmann, K.
(2014),
Advanced phasemeter for deep phase modulation interferometry, Optics Express
(Accessed May 9, 2025)
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Advanced phasemeter for deep phase modulation interferometry
Published
Author(s)
Thomas Schwarze, Oliver Gerberding, , Gerhard Heinzel, Karsten Danzmann
Abstract
We present the development of an advanced phasemeter for the deep phase modulation interferometry technique. This technique aims for precise length measurements with a high dynamic range using little optical hardware. The advanced phasemeter uses fast ADCs and an FPGA to implement a design of multiple single-bin Fourier transforms running at high sampling rates. Non-linear noise sources in the design were analyzed and suppressed. A null measurement with an optical beatnote signal using λ = 1064 nm was conducted. It showed a sensitivity of 0.8 μrad/√Hz below 10 Hz and 13.3 μrad/√Hz above, with a large dynamic range. The shown performance could enable the measuring of optical path lengths with sensitivities down to 0.14 pm/√Hz and 2.3 pm/√Hz, respectively, over several fringes in an interferometric setup.Citation
Optics Express
Pub Type
Journals
Keywords
interferometry, phasemeter, instrumentation, optical measurement
Citation
Issues
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Created July 20, 2014, Updated October 12, 2021