Accurate High-Ohmic Resistance Measurement Techniques up to 1 Pohm
Dean G. Jarrett, Gert Rietveld, Beat Jeckelmann
An overview is presented on precision high-ohmic resistance measurements for values of 100 Mohmand above. The two main measurement techniques in this resistance range are discussed, the current integration technique and the adapted Wheatstone bridge. The quality of high-ohmic resistance standards, especially their time constants, temperature and voltage dependence, often is limiting the final uncertainty that can be reached. Still, expanded uncertainties (k = 2) of only a few parts in 10^5 are achievable at the 1 Tohm level.
CPEM 2014 Conference Digest
August 24-29, 2014
Rio de Janeiro
Conference on Precision Electromagnetic Measurements (CPEM) 2014