U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Accurate High-Ohmic Resistance Measurement Techniques up to 1 Pohm

Published

Author(s)

Dean G. Jarrett, Gert Rietveld, Beat Jeckelmann

Abstract

An overview is presented on precision high-ohmic resistance measurements for values of 100 Mohmand above. The two main measurement techniques in this resistance range are discussed, the current integration technique and the adapted Wheatstone bridge. The quality of high-ohmic resistance standards, especially their time constants, temperature and voltage dependence, often is limiting the final uncertainty that can be reached. Still, expanded uncertainties (k = 2) of only a few parts in 10^5 are achievable at the 1 Tohm level.
Proceedings Title
CPEM 2014 Conference Digest
Conference Dates
August 24-29, 2014
Conference Location
Rio de Janeiro
Conference Title
Conference on Precision Electromagnetic Measurements (CPEM) 2014
Pub Type
Conferences

Keywords

Resistance, resistance measurements, high-ohmic, adapted Wheatstone bridge, teraohmmeter, resistance scaling, precision measurement
Standards

Citation

Jarrett, D. , Rietveld, G. and Jeckelmann, B. (2014), Accurate High-Ohmic Resistance Measurement Techniques up to 1 Pohm, CPEM 2014 Conference Digest, Rio de Janeiro, -1 (Accessed September 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 24, 2014, Updated February 19, 2017