Ac-dc Difference at Cryogenic Temperatures

Published

August 1, 2003

Author(s)

Thomas E. Lipe Jr., Joseph R. Kinard Jr., Carl D. Reintsema

Abstract

We are continuing the development of a new primary standard for ac-dc difference that utilizes a superconducting resistive transition-edge device as the sensor. The most recent improvements to the Cryogenic Thermal Transfer Standard (CTTS) include on-chip magnetic shielding which has reduced the coupling of magnetic fields from the heaters into the transition-edge sensor; however, measurements indicate that errors still persist in the CTTS. To isolate these errors, we propose an experiment to measure two CTTS chips inside the cryostat, where transmission line and similar effects will be negligible. In addition, we are redesigning the sensor chip to improve its performance at higher power levels.

Proceedings Title

NCSL International Workshop and Symposium

Conference Dates

August 17-21, 2003

Conference Location

Tampa, FL, USA

Conference Title

National Conference of Standards Laboratories

Pub Type

Conferences

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Keywords

Electrical Metrology, Thermal Converter, Thermal Transfer Standard, Transition-edge Sensor, Ac-dc Difference, Cryogenic Detectors

Citation

Lipe Jr., T. , Kinard Jr., J. and Reintsema, C. (2003), Ac-dc Difference at Cryogenic Temperatures, NCSL International Workshop and Symposium, Tampa, FL, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31342 (Accessed October 9, 2025)