Lipe Jr., T.
, Kinard Jr., J.
and Reintsema, C.
(2003),
Ac-dc Difference at Cryogenic Temperatures, NCSL International Workshop and Symposium, Tampa, FL, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31342
(Accessed January 26, 2025)
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Ac-dc Difference at Cryogenic Temperatures
Published
Author(s)
, ,
Abstract
We are continuing the development of a new primary standard for ac-dc difference that utilizes a superconducting resistive transition-edge device as the sensor. The most recent improvements to the Cryogenic Thermal Transfer Standard (CTTS) include on-chip magnetic shielding which has reduced the coupling of magnetic fields from the heaters into the transition-edge sensor; however, measurements indicate that errors still persist in the CTTS. To isolate these errors, we propose an experiment to measure two CTTS chips inside the cryostat, where transmission line and similar effects will be negligible. In addition, we are redesigning the sensor chip to improve its performance at higher power levels.Proceedings Title
NCSL International Workshop and Symposium
Conference Dates
August 17-21, 2003
Conference Location
Tampa, FL, USA
Conference Title
National Conference of Standards Laboratories
Pub Type
Conferences
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Keywords
Electrical Metrology, Thermal Converter, Thermal Transfer Standard, Transition-edge Sensor, Ac-dc Difference, Cryogenic Detectors
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 31, 2003, Updated October 12, 2021