During the past decade with increased computing power and new research developments, Bayesian statistical methods have become practical in diverse areas of statistical applications. Bayesian methods provide a unified framework for optimally combining information from multiple sources, resulting in simpler and improved statistical analyses. Despite the widespread growth in Bayesian methods, for the most the field of metrology has not taken advantage of these methods. Both NIST researchers and their customers have much to gain from these methods.
Recognizing the potential, NIST statisticians began exploring the use of Bayesian methods in several metrological applications. After some initial research, a five year competence initiative on Bayesian metrology was started in FY99.
Research, develop, and apply Bayesian methods to the metrological problems of NIST; promulgate results to other metrology laboratories and to NIST customers.
Four specific areas are targeted:
The timelines and milestones for this project are:
ITL has performed the following work for this project.