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Basic Metrology: High-Resolution X-Ray Spectroscopy


We are pursuing a program of x-ray spectroscopy of highly-charged ions and plasmas using custom-designed and constructed curved crystal spectrometers.


X-ray Spectroscopy

X-ray sources of interest include Electron Beam Ion Trap (EBIT), Electron Cyclotron Resonance Ion Source (ECRIS), and laser-produced plasma ion sources, including the new generation of petawatt lasers. In support of these efforts, we also maintain laboratory x-ray sources from 1 keV to 300 keV, energy and intensity calibration facilities, and a vacuum double-crystal spectrometer for precision wavelength measurements tied to the definition of the meter. In addition to both applied and fundamental data and processes, emphasis is placed on advanced and novel instrument development, precision metrology, and techniques of calibration.

Created February 26, 2013, Updated April 27, 2021