Tommy Boykin II is a postdoctoral research associate at the National Institute of Standards and Technology in the Advanced Electronics Group working with Evgheni Strelcov. His research focuses on characterizing silicon carbide devices to screen the reliability of power electronic devices. Tommy earned his B.A. in physics in 2013 from Berea College, M.S. in physics in 2016 and Ph.D. in physics in 2019 from the University of Central Florida. His thesis work focused on determining the structure of squid protein by solid-state nuclear magnetic resonance. During graduate school, he was awarded an international research experience in Japan with the telecommunications company, Nippon Telegraph and Telephone. Tommy has been awarded a NIST Postdoctoral and Early-Career Association of Researchers Service Accolade.