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Purnima Balakrishnan (Fed)

Publications

Lab-based multi-wavelength EUV diffractometry for critical dimension metrology

Author(s)
Bryan Barnes, Aaron Chew, Nicholas Jenkins, Yunzhe Shao, Martin Sohn, Regis Kline, Daniel Sunday, Purnima Balakrishnan, Thomas Germer, Steven Grantham, Clay Klein, Stephanie Moffitt, Eric Shirley, Henry Kapteyn, MARGARET MURNANE
Background: The industry is developing extreme-ultraviolet wavelength (EUV) techniques to measure critical dimensions (CDs) in logic fabrication. As nascent

Evidence of Antiferromagnetism in Ultrathin Metallic (111)-Oriented LaNiO3 Films

Author(s)
Margaret Kane, Purnima P. Balakrishnan, Okan Koksal, Megan Holtz, Andreas Suter, Michael R. Fitzsimmons, Chao-Yao Yang, Christoph Klewe, Paige Quarterman, Timothy R. Charlton, Andrew Herzing, Zaher Salman, Thomas Prokscha, Rossitza Pentcheva, Alexander Grutter, Yuri Suzuki
Antiferromagnets with exotic spin textures promise low-power spintronic devices with extremely high operating frequencies and resistance to external
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Created December 8, 2019, Updated August 28, 2024
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