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Fan Zhang, Aaron Johnston-Peck, Lyle E. Levine, Michael Katz, Kil-Won Moon, Maureen E. Williams, Sandra W. Young, Andrew J. Allen, Olaf Borkiewicz, Jan Ilavsky
Additive Manufacturing (AM) technologies offer unprecedented design flexibility but are limited by a lack of understanding of the material microstructure formed
June W. Lau, Karl B. Schliep, Michael B. Katz, Vikrant J. Gokhale, Jason J. Gorman
A 300 keV transmission electron microscope was modified to produce broadband pulsed beams, that can be in principle, between 40 MHz to 12 GHz, corresponding to
For two decades, time-resolved transmission electron microscopes (TEM) have relied on pulsed-laser photoemission to generate electron bunches to explore sub
A sample carrier for in situ transmission electron microscopy (TEM) has a dielectric substrate with a conductive layer that forms a coplanar waveguide. The coplanar waveguide has a first and second leads formed by the conductive layer. The first lead is between an adjacent pair of second leads and