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June W. Lau, Karl B. Schliep, Michael B. Katz, Vikrant J. Gokhale, Jason J. Gorman
A 300 keV transmission electron microscope was modified to produce broadband pulsed beams, that can be in principle, between 40 MHz to 12 GHz, corresponding to
For two decades, time-resolved transmission electron microscopes (TEM) have relied on pulsed-laser photoemission to generate electron bunches to explore sub
William J. Boettinger, Dale E. Newbury, Nicholas W. Ritchie, Maureen E. Williams, Ursula R. Kattner, Eric Lass, Kil-Won Moon, Michael B. Katz
Differential thermal analysis (DTA) and microstructural and microprobe measurements of DTA and as-cast Ni-Re alloys with compositions between 0.20 and 0.44 mass
A sample carrier for in situ transmission electron microscopy (TEM) has a dielectric substrate with a conductive layer that forms a coplanar waveguide. The coplanar waveguide has a first and second leads formed by the conductive layer. The first lead is between an adjacent pair of second leads and