John E. Bonevich

Staff Employment

2013 - Present: Deputy Chief, Materials Science and Engineering Division

2012 - 2013: Leader, Thin Film and Nanostructure Processing Group

1995 - 2012: Staff Scientist, Metallurgy Division, NIST

1994 - 1995: Research Fellow, National Center for Electron Microscopy, Lawrence Berkeley National Laboratory

1991 - 1994: HIVIPS Scientist, Advanced Research Laboratory, Hitachi, Saitama, Japan

Areas of Expertise

Publications

Particle Size Distributions for Cellulose Nanocrystals Measured by Transmission Electron Microscopy: An Interlaboratory Comparison

October 6, 2020

Author(s)

John E. Bonevich, Juris Meija, Bushell Michael, Martin Couillard, Kai Cui, Johan Foster, Douglas M. Fox, Markus Heidelmann, Byong Chon Park, Lingling Ren, Aleksandr B. Stefaniak, Ralf Theissmann, Natalia de Val Alda, Linda Johnston

Particle size is one of the key parameters that must be measured to ensure reproducible production of cellulose nanocrystals (CNCs) from various types of

The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis

July 31, 2020

Author(s)

James Cline, Marcus Mendenhall, Joseph J. Ritter, David R. Black, Albert Henins, John E. Bonevich, Pamela S. Whitfield, James J. Filliben

This rather long-standing project has resulted in a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) for the analysis of

A workshop report on Electron Microscopy Frontiers: Challenges and Opportunities

December 21, 2017

Author(s)

June W. Lau, John E. Bonevich, Andrew A. Herzing, Ann C. Chiaramonti Debay, Robert R. Keller

For two days beginning on March 8, 2017, a planning workshop entitled Electron Microscopy Frontiers: Opportunities and Challenges was hosted by the Material

Redox-Active Molecular Nanowire Flash Memory for High-Endurance and High-Density Non-Volatile Memory Applications

December 16, 2015

Author(s)

Hao Zhu, Sujitra J. Pookpanratana, John E. Bonevich, Sean Natoli, Christina A. Hacker, Tong Ren, John S. Suehle, Curt A. Richter, Qiliang Li

Heat Transfer Through Nanoscale Multilayered Thermal Barrier Coatings at Elevated Temperatures

August 15, 2015

Author(s)

Daniel Josell, Thao M. Nguyen, John E. Bonevich

Heat transfer through thermal barrier coatings (TBCs) composed of alternating nanometer thick layers of aluminum oxide and 7% yttria stabilized zirconia (7YSZ)

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Staff Employment

2013 - Present: Deputy Chief, Materials Science and Engineering Division

2012 - 2013: Leader, Thin Film and Nanostructure Processing Group

1995 - 2012: Staff Scientist, Metallurgy Division, NIST

1994 - 1995: Research Fellow, National Center for Electron Microscopy, Lawrence Berkeley National Laboratory

1991 - 1994: HIVIPS Scientist, Advanced Research Laboratory, Hitachi, Saitama, Japan

Areas of Expertise

John E. Bonevich (Fed)

Awards

Publications

Particle Size Distributions for Cellulose Nanocrystals Measured by Transmission Electron Microscopy: An Interlaboratory Comparison

The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis

A workshop report on Electron Microscopy Frontiers: Challenges and Opportunities

Redox-Active Molecular Nanowire Flash Memory for High-Endurance and High-Density Non-Volatile Memory Applications

Heat Transfer Through Nanoscale Multilayered Thermal Barrier Coatings at Elevated Temperatures