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John E. Bonevich (Fed)

Research interests include:

  • High resolution / analytical electron microscopy
  • Scanning transmission electron microscopy
  • Electron holography
  • Electron tomography
  • Interfacial structure and chemistry
  • Nano-structured materials
  • Magnetic materials
  • Digital imaging and analysis

Honors and Awards:

  • Department of Commerce Silver Medal - 2008

Professional Societies:

  • Microscopy Society of America
  • Microbeam Analysis Society
  • Materials Research Society

Selected Publications

Electrodeposition of Ni in Sub-Micrometer Trenches

S D. Kim, John E. Bonevich, Daniel Josell, Thomas P. Moffat
A survey of the effect of cationic, anionic and non-ionic surfactants on the rate and morphological evolution of nickel electrodeposition from a Watts-type bath


Particle Size Distributions for Cellulose Nanocrystals Measured by Transmission Electron Microscopy: An Interlaboratory Comparison

John E. Bonevich, Juris Meija, Bushell Michael, Martin Couillard, Kai Cui, Johan Foster, Douglas M. Fox, Markus Heidelmann, Byong Chon Park, Lingling Ren, Aleksandr B. Stefaniak, Ralf Theissmann, Natalia de Val Alda, Linda Johnston
Particle size is one of the key parameters that must be measured to ensure reproducible production of cellulose nanocrystals (CNCs) from various types of
Created March 29, 2019, Updated December 8, 2022