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James G. Kushmerick (Fed)

PML Director

Dr. James Kushmerick is Director of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST) where he is responsible for the maintenance, development, and dissemination of the U.S. national measurement standards system, and he oversees NIST’s world-class programs in quantum information science, neuromorphic computing, and quantum measurement standards. He also directs the full suite of NIST calibration services in dimensional, electromagnetic, ionizing radiation, mechanical, optical, thermodynamic, and time and frequency metrology.

Dr. Kushmerick received a B.S. in Chemistry from the University of Delaware and a Ph.D. in Physical Chemistry from the Pennsylvania State University. Following postdoctoral research at Sandia National Laboratories, and four years as a Research Chemist at the Naval Research Laboratory, Jim joined the NIST staff in 2005 to continue his research on nanoscale electronics. His research focused on probing the fundamentals of charge transport in nanoscale systems by exploiting in situ electronic and vibronic spectroscopies. He has over 50 publications in peer-reviewed journals and holds four patents in the areas of directed assembly of nanoscale devices and monolayer-based nanoscale switches.

Publications

Influence of substrate on crystallization in polythiophene/fullerene blends

Author(s)
Lee J. Richter, Christine He, David Germack, R Joseph Kline, Dean DeLongchamp, Daniel A. Fischer, Chad R. Snyder, James G. Kushmerick
The nanoscale morphology of the active layer in organic, bulk heterojunction (BHJ) solar cells is crucial to device performance. Often a combination of casting

Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors

Author(s)
Lucile C. Teague, Behrang H. Hamadani, John E. Anthony, David J. Gundlach, James G. Kushmerick, Sanker Subramanian, Thomas Jackson, Curt A. Richter, Oana Jurchescu
We report scanning Kelvin probe microscopy (SKPM) of electrically biased difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TESADT) organic thin film
Created August 15, 2019, Updated March 24, 2023