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Electron-excited X-ray microanalysis with energy-dispersive spectrometry (EDS) proceeds through the application of the software that extracts characteristic X
NIST DTSA-II is an open-source, comprehensive software platform for the analysis and simulation of electron-excited energy dispersive X-ray spectra (EDS). EDS
EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited X-ray microanalysis with energy