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Carlos R. Beauchamp

Research interests include:

  • Production and Certification of Standard Reference Materials
  • Electrochemical deposition of thin films

 

Publications

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael S. Epstein, Margaret C. Kline, Katrice A. Lippa, Enrico Lucon, Karen W. Phinney, Maria Polakoski, Antonio M. Possolo, Katherine E. Sharpless, John R. Sieber, Blaza Toman, Michael R. Winchester, Donald A. Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged

Backcontact CdSe/CdTE Windowless Solar Cells

Author(s)
Donguk Kim, Carlos M. Hangarter, Ratan K. Debnath, Jong Yoon Ha, Carlos R. Beauchamp, Matthew D. Widstrom, Jonathan E. Guyer, Nhan V. Nguyen, B. Y. Yoo, Daniel Josell
This paper details the fabrication and properties of CdSe/CdTe thin film photovoltaic devices with a dual back contact geometry. Device fabrication involves
Created October 9, 2019, Updated December 9, 2019