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Search Patents by Chris Long

Patents listed here reflect only technologies patented from FY 2018-present. To view all of NIST's patented technologies, visit the NIST pages on the Federal Laboratory Consortium website.

Displaying 1 - 3 of 3

Scanning Microwave Ellipsometer And Performing Scanning Microwave Ellipsometry

NIST Inventors
Chris Long , Nate Orloff and Edward Garboczi
A scanning microwave ellipsometer includes: a microwave ellipsometry test head including: a polarization controller; a transmission line; and a sensor that produces sensor microwave radiation, subjects a sample to the sensor microwave radiation, receives a sample reflected microwave radiation from

Scanning Microwave Ellipsometer And Performing Scanning Microwave Ellipsometry

NIST Inventors
Chris Long , Nate Orloff and Edward Garboczi
New strong, light, and compact formed carbon fiber components require shorter, higher-aspect ratio carbon fibers. Shorter carbon fibers must be aligned to realize the desired tensile strength. Before this invention, industry lacked a tool to characterize carbon fiber alignment for inline quality
A photo of the noncntact dielectric and conductivity meter for high-throughput processing and a circuit diagram of the circuit used to track the resonant frequency and quality factor of the microwave resonator.

Noncontact Resonameter, Process for making and use of same

NIST Inventors
Jan Obrzut , Nate Orloff and Chris Long
A noncontact resonameter includes: a resonator to: produce an excitation signal including a field; subject a sample to the excitation signal; produce a first resonator signal in a presence of the sample and the excitation signal, the first resonator signal including: a first quality factor of the
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