Dr. Muralikrishnan’s seminal research in precision dimensional metrology is accelerating the adoption of next-generation coordinate scanning. He developed sophisticated mathematical models to help quantify and mitigate sources of error in coordinate measuring systems. His models provide the basis for objective consensus national and international documentary standards, test artifacts, and test methods for the monitoring of structural changes in buildings, bridges, and other critical infrastructure due to settling, aging, deterioration, or earthquake damage. The scanning technologies he standardized are used to assemble and inspect large manufactured structures; to document archeological digs and sites; and to capture the details of accidents and crime scenes, including the Champlain Towers collapse site in Surfside, Florida.