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Workshop on Analytical Transmission Scanning Electron Microscopy

The emergence of transmission approaches to imaging and diffraction within the scanning electron microscope (SEM) has opened the door to a new realm of characterization that both extends established limits of conventional SEM and complements the strengths of the transmission electron microscope (TEM).

This workshop seeks to:

  • Assess state of the art in SEM transmission techniques (imaging, diffraction, spectroscopy), including relationships to other tools such as the helium ion microscope, focused ion beam microscope, and TEM/STEM;
  • Identify specific areas of R & D and standardization that must be addressed in order to enable this new form of characterization to see widespread adoption;
  • Unify the global effort to accelerate the development of analytical transmission SEM techniques beyond the curiosities that they largely are today.

Meeting Format:

The meeting will include:

  • serial sessions on diffraction, imaging, spectroscopy, and complementary transmission technologies;
  • session panel discussions led by our plenary speakers;
  • oral poster summaries and poster viewing;
  • laboratory tour of the new NIST Precision Imaging Facility;
  • roadmapping/strategies for collaboration.

Attendees are invited to present a brief (~ 1-2 minutes) oral summary/poster preview of their work on transmission SEM and/or related technologies; display a poster on their research; and to actively participate in the discussions in each of our sessions.

The final output will be a publicly-available NIST Special Publication summarizing the workshop findings. We will also discuss strategies during the meeting for other forms of dissemination by key attendees.



We have a limited number of slots for poster presenters covering ANY aspects of SEM-based transmission technique application and/or development. Prospective poster presenters should submit a 1-page abstract electronically in PDF format to Bob Keller, adhering to the guidelines below:

  • Language: English
  • Paper size: US Letter
  • Page limit: 1 page
  • File format: a single PDF no larger than 4 Mb – may include figures
  • Be sure to include: Title, Authors, Affiliations, Mailing Address, Email of contact author
  • When no additional posters can be accepted, this website will be updated accordingly
  • Posters will be mounted onto 4' x 8' poster stands with push pins, two on each side of the stand. Please ensure your poster is no larger than 48" x 48".


Agenda PDF (updated 9/9)

Tuesday,15 September, 2015

7:45 AM– Millennium Harvest House Hotel guests board shuttle to NIST

8:00 AM- 9:00 AM Check-in at NIST Visitor Center and Continental Breakfast in meeting room (photo ID required for entrance to NIST site)

Session I:Welcome/Keynote

9:00 AM Workshop Welcome - Bob Keller, NIST

9:15 AM Keynote – STEM: It has all been done before! (well maybe not everything) - Joseph Michael, Sandia National Laboratory

10:15 AM Coffee/Poster Setup

Session II: Diffraction

10:45 AM:  Nanomaterials characterization using transmission Kikuchidiffraction: a breakthrough or a curiosity? - Patrick Trimby, University of Sydney

11:45 AM Electron Imaging using an EBSD Detector – Applications for Reflection and Transmission EBSD Geometries - Matt Nowell, EDAX/Ametek

12:45 PM Lunch in meeting room/Brief NIST Welcome - Jim Fekete, NIST Applied Chemicals & Materials Division Chief

1:45 PM Diffraction Discussion Session

2:30 PM Poster Introductions (up to 4 minutes each)

3:15 PM Coffee/Poster Session


Session III: Imaging

3:45 PM Transmission diffraction, spectroscopy, imaging in the SEM -Raynald Gauvin, McGill University

4:45 PM From Bragg Diffraction to HAADF Imaging: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector- Jason Holm, NIST

5:45 PM Imaging Discussion

6:30 PM End of Day 1 – Millennium Harvest House guests board shuttle to hotel

7:00 PM Plenary speaker group dinner at Zolo Southwestern Grill in Boulder – reservation made for 10 people

Wednesday,16 September, 2015

7:45 AM – Millennium Harvest House Hotel guests board shuttle to NIST

8:00 AM Continental Breakfast in meeting room

8:15 AM Housekeeping

Session IV: Spectroscopy

8:30 AM Silicon Drift Detector Energy Dispersive X-ray Spectrometry(SDD-EDS): A Transformative Technology for Electron-Excited Elemental Analysis- Nicholas Ritchie, NIST

9:30 AM EELS in the SEM - Ray Twesten, Gatan

10:30 AM Coffee/Poster Session

11:00 AM Spectroscopy Discussion Session

11:45 AM Lunch in meeting room

Session V:Complementary Technologies

12:45 PM Application of Low Voltage Electron Microscopy for New Science and Materials - David Bell, Harvard University

1:45 PM Transmission Imaging with a Focused Helium Ion Beam - John Notte, Carl Zeiss

2:45 PM Coffee/Poster Session

3:15 PM Tour of the NIST Precision Imaging Facility (AC-TEM, FIB,HIM, APT) – Aric Sanders, NIST


Session VI: Roadmapping and Collaboration

4:15 PM Summary Discussions of the Future of Transmission SEM, Routes for Strategic Collaboration

5:45 PM Closing Remarks and Departure

6:00 PM Meeting ends

Millennium Harvest House, Boulder
1345 Twenty-Eighth Street
Boulder, CO 80302
Book Online: FBC,Room Block
or Call 1(800) 545-6285 code 1509FBCINC
Book By 9/4/2015


If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.

NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays (up to 24 hours) in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12. When registration is open, the required NIST-1260 form will be available as well.

*New Visitor Access Requirement: Effective July 21, 2014, Under the REAL ID Act of 2005, agencies, including NIST, can only accept a state-issued driver's license or identification card for access to federal facilities if issued by states that are REAL ID compliant or have an extension. Driver's licenses from nine states and territories are not compliant and will not be accepted as identification: Alaska, Arizona, Montana, Oklahoma, Louisiana, Kentucky, Massachusetts, Maine, and American Samoa. In addition, NIST will accept only enhanced driver's licenses (identified by the American Flag on the face of the card) from three states: Minnesota, New York, and Washington State. Click here for a list of alternative identification and further details>>

Created July 22, 2015, Updated July 31, 2018