The participants in this workshop were scientists and physician scientists from the academic, government and private sectors. The common thread uniting the audience was a focus on advancing measurement tools for the better diagnosis and management of Lyme disease.
NIST Lyme Disease Workshop Agenda
NIST Lyme Disease Workshop Bibliography
The workshop was webcast from this page June 6, 2013 and is available for playback. Breakout Sessions were not webcast live.
Comments during the webcast? Please submit to: lymediseaseworkshop [at] nist.gov (lymediseaseworkshop[at]nist[dot]gov)
Funding for lunch, beverages and snacks is graciously provided by the Tick-Borne Disease Alliance, the Bay Area Lyme Foundation, and the Lyme Research Alliance.
Confirmed Topics and Speakers
Topic | Speaker |
NIST Supporting Measurements for Clinical Diagnostics | Willie E. May, PhD, NIST |
Keynote Address: Setting the Stage | John Aucott, MD, Johns Hopkins University |
Clinical and Laboratory Challenges of Lyme Disease Diagnostics | Adriana Marques, MD, NIH-NIAID |
Improved Serology | Ray Dattwyler, MD, New York Medical College |
DNA Detection | Mark Eshoo, PhD, Ibis Biosciences, Inc., Abbott Laboratories |
T Cell / Cytokine Assays | Linda Bockenstedt, MD, Yale University |
Nanotechnology | A.T. Charlie Johnson, PhD, University of Pennsylvania |
Biorepository Needs and Possiblities | Lunch Roundtable Discussion |
RNA Detection and Host Response | Charles Chiu, MD/PhD, University of California, San Francisco |
Mass Spectrometry / Metabolomics | John Belisle, PhD, Colorado State University |
Culture | Steve Dumler, MD, Johns Hopkins University |
Imaging | Niren Murthy, PhD, University of California, Berkeley |
Time will also be provided for breakout sessions for discussion of research topics.
If you are not registered, you will not be allowed on site.
Registered attendees will receive security and campus instructions prior to the workshop.
NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays (up to 24 hours) in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12. You can download the required form NIST-1260. Fill out the form and email to Mary Satterfield [mary.satterfield [at] nist.gov (mary[dot]satterfield[at]nist[dot]gov)].