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Antenna Parameter Measurement by Near-Field Techniques Short Course

The purpose of the short course is to transfer NIST antenna measurement technology to industry and other agencies.

This course is designed for engineers and scientists concerned with the accurate measurement of antenna parameters. Major emphasis will be placed on the theory of near-field antenna-antenna interactions, applications to near-field scanning on planar, cylindrical, and spherical surfaces, and the computation of desired antenna characteristics from near-field data. Comparisons will be made of the planar, cylindrical, and spherical scanning methods, and the advantages and disadvantages of each will be discussed. In addition, the extrapolation method of determining absolute gain and polarization will be treated and probe pattern measurements discussed.

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Created May 13, 2014, Updated May 13, 2016