Learning and adaptation are key to natural and artificial intelligence in complex and variable environments. Advances in machine learning and system-on-chip very-large-scale-integration have led to the development of massively parallel silicon learning machines with pervasive real-time adaptive intelligence that begin to approach the efficacy and resilience of biological neural systems, and already exceed the nominal energy efficiency of synaptic transmission in the mammalian brain. I will highlight examples of neuromorphic learning systems-on-chips with applications in template-based pattern recognition, vision processing, and human-computer interfaces, and outline emerging scientific directions and engineering challenges in their large-scale deployment.
1:00 p.m. - 2:00 p.m. (Gaithersburg, Bldg. 221, Room B145)
11:00 a.m. - 12:00 p.m. (Boulder, VTC in 81-1A116)
Gert Cauwenberghs is Professor of Bioengineering and Co-Director of the Institute for Neural Computation at UC San Diego. He received the Ph.D. in Electrical Engineering from Caltech in 1994, and was previously Professor of Electrical and Computer Engineering at Johns Hopkins University, and Visiting Professor of Brain and Cognitive Science at MIT. His research focuses on neuromorphic engineering, adaptive intelligent systems, neuron-silicon and brain-machine interfaces, and micropower biomedical instrumentation. He is a Fellow of the Institute of Electrical and Electronic Engineers (IEEE) and the American Institute for Medical and Biological Engineering (AIMBE), and was a Francqui Fellow of the Belgian American Educational Foundation. He previously received NSF CAREER, ONR Young Investigator Program and White House PECASE awards. He served IEEE in a variety of roles including most recently as Editor-in-Chief of the IEEE Transactions on Biomedical Circuits and Systems.
Outside attendees need to contact Barry Schneider in order to obtain the site badges required to enter NIST grounds and to attend the seminar. 24 hour notice is required for US citizens and 3 days for non-US citizens. Please contact email@example.com(link sends e-mail) to be added to the visitor list. Visitors must check in at the NIST Visitor Center to pick up their badges. A photo ID is required for US citizens and a passport or green card for foreign nationals. There is also the possibility of viewing the seminar as a webcast. Again, please contact Barry Schneider for details preferably by email.