The BioImage Informatics (BII) conference will bring together researchers and practitioners in the field of image informatics for the life sciences. The BII conference was created in 2005 to establish a unique communication network among the scientists working in the field of BioImage Informatics. The BioImage Informatics conference covers a wide range of topics that would be classified under the following themes:
Applications to cell therapy, digital pathology, and regenerative medicine
Data mining and machine learning of image information
Advanced visualization of bioimages and image derived information
Storage and repositories of biological data sets
Collaborative frameworks, pipelines, and environments
Fundamental algorithms (e.g., calibration, segmentation, tracking, feature-based image analysis, data-driven and hypothesis-driven modeling)
Advanced imaging approaches and instruments
Reproducibility and large scale imaging experiments
Other topics relevant to life science imaging and image informatics.
Challenges: Concurrent with the conference, we will run two challenges to evaluate image stitching and nucleus counting algorithms. Details regarding these challenges can be found below.
Submission Deadline: May 17, 2015 - Deadline Extended to June 12, 2015
Decision Notification (Electronic): July 13, 2015
Poster Deadline: August 16, 2015
Poster Decision Notification (Electronic): August 23, 2015
Oral and Poster Camera-Ready Copy Due Date and Pre-registration Due: September 14, 2015
Submission process and guidelines:
The paper and poster submissions will be reviewed by the organizing committee. All submissions should be between 1 and 4 pages with a selection of preferred oral or poster presentation type. Both types of submissions should follow the template. All submissions should be submitted to bioimage [at] nist.gov (.)
To promote scientific collaboration, we will distribute submitted abstracts on-line after the conference. Selected contributions will also be invited as manuscripts for a special issue of a major bioinformatics journal.
Scientific Program Chairs:
Peter Bajcsy, Information Technology Laboratory, NIST
Manfred Auer, Lawrence Berkeley National Lab
Andrew Cohen, Drexel University
Sebastian Munck, VIB, Belgium
Carolina Wahlby, Uppsala University, Sweden
Local Organizing Committee:
Patricia Wilburg, Information Technology Laboratory, NIST
Michael Halter, Material Measurements Laboratory, NIST
Carl Simon, Material Measurements Laboratory, NIST
Antonio Cardone, UMIACS, University of Maryland
Yelena Yesha, Computer Science and Electrical Engineering Dept., University of Maryland Baltimore County
Aryya Gangopadhyay, Information Systems Department, University of Maryland Baltimore County
USA: Michael Halter, NIST, USA
Asia: Sang-Chul Lee, Inha University, Korea
Australia: Tomasz Bednarz, The Commonwealth Scientific and Industrial Research Organisation (CSIRO), Australia
Europe: Jens Rittscher, The Institute of Biomedical Engineering, University of Oxford, UK
Stitching: Joe Chalfoun, NIST
Nucleus Counting: Maric Dragan, NIH
Hanchuan Peng (Chair and Meeting Founder; Allen Institute for Brain Science)
Manfred Auer (Lawrence Berkeley National Lab)
Anne Carpenter (Broad Institute)
Michael Hawrylycz (Allen Institute for Brain Science)
Visa: Please, send your request to bioimage [at] nist.gov if you would like to receive an invitational travel letter. It is recommended to check the following page, U.S. Visa, to determine the time it will take to issue the visa prior to your travel date.
Travel: Please visit the NIST Visitor Page for directions and information on local airports, public transportation and local accommodations.
If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.
NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays (up to 24 hours) in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12. When registration is open, the required NIST-1260 form will be available as well.