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2014 Woodington Award - James Olthoff

Woodington Award For Professionalism in Metrology

This award, sponsored as a memorial to the late Andrew J. Woodington, is the measurement community’s recognition of an individual who represents the highest level of professionalism, and dedication to the Metrology profession.

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Nominees for the Woodington Award are to have exhibited noteworthy professional achievement in the Metrology field. Nominees are to have warranted national or international recognition and acceptance as Metrology professionals who consistently perform and conduct themselves with dedication, competence, and commitment, and also inspire and enhance the professional status of others working in Metrology. The areas of achievement and expertise to be demonstrated by the nominees need not be restricted to technical, as managerial and administrative contributions are equally important. All in all, the winner of the Woodington Award must represent the highest level of professionalism and dedication to the Metrology community.

Created September 11, 2017
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