The Semiconductor and Dimensional Metrology Division (SDMD) provides leadership in conducting research in the areas of dimensional, nanometer-scale, surface, and acoustic pressure metrology; accelerometry; silicon Complementary Metal-Oxide Semiconductor (CMOS) technology; MicroElectroMechanical Systems (MEMS); power electronics; nanoelectronics; and flexible/printed electronics.
The technical programs, their goals, technical strategies, activities, and accomplishments described here for each Division project clearly demonstrate the impact of the SDMD's leadership and effective service as it continues to respond to the needs of industry and to contribute to the scientific and engineering communities.
Thank you for your interest in our Division! I welcome your comments and suggestions.
David Seiler, Division Chief
Popular LinksSenior and Post-doctoral NIST-ARRA Fellowships AnnouncementHall Effect2013 Metrology Frontiers for Nanoelectronics Conference, NIST, GaithersburgA Framework for Bioelectronics: Discovery and InnovationNanoscale Measurements With TSOM Optical Method - Presentation by R. Attota
Physical Measurement Laboratory (PML)