Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Curt A. Richter; Hao Xiong; Xiaoxiao Zhu; Wenyong Wang; Vincent M. Stanford; Qiliang Li; D. E. Ioannou; Woong-Ki Hong; Takhee Lee;|
|Title:||Measurements for the Reliability and Electrical Characterization of Semiconductor Nanowires|
|Published:||April 30, 2008|
|Abstract:||Nanoelectronic devices based upon self-assembled semiconductor nanowires are excellent research tools for investigating the behavior of structures with sub-lithographic features as well as a promising basis for future information processing technologies. We describe two unique approaches to successfully fabricate nanowire devices, one based upon harvesting and positioning nanowires, and one based upon the direct growth of nanowires in predefined locations. Test structures are fabricated and electronically characterized to probe the fundamental properties of chemical-vapor-deposition grown silicon nanowires. Important information about current transport and fluctuations in materials and devices can be derived from noise measurements, and low frequency 1/f noise has traditionally been utilized as a quality and reliability indicator for semiconductor devices. Both low frequency 1/f noise and random telegraph signals are shown here to be powerful methods for probing trapping defects in nanoelectronic devices.|
|Conference:||International Reliability Physics Symposium|
|Proceedings:||Proceedings of the 46th Annual IEEE Reliability Physics Symposium 2008|
|Pages:||pp. 39 - 45|
|Dates:||April 27-30, 2008|
|Keywords:||nanoelectronics, semiconductor nanowires, 1/f noise, test structures|
|Research Areas:||Nanoelectronics and Nanoscale Electronics|
|PDF version:||Click here to retrieve PDF version of paper (552KB)|