@conference{203006,
  author = {Curt Richter and Hao Xiong and Xiaoxiao Zhu and Wenyong Wang and Vincent Stanford and Qiliang Li and D. Ioannou and Woong-Ki Hong and Takhee Lee},
  title = {Measurements for the Reliability and Electrical Characterization of Semiconductor Nanowires},
  year = {2008},
  month = {2008-04-30},
  publisher = {Proceedings of the 46th Annual IEEE Reliability Physics Symposium 2008, Phoenix, AZ},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32971},
  language = {en},
}