TY  - CONF
AU  - Curt Richter
AU  - Hao Xiong
AU  - Xiaoxiao Zhu
AU  - Wenyong Wang
AU  - Vincent Stanford
AU  - Qiliang Li
AU  - D. Ioannou
AU  - Woong-Ki Hong
AU  - Takhee Lee
C2  - Proceedings of the 46th Annual IEEE Reliability Physics Symposium 2008, Phoenix, AZ
DA  - 2008-04-30
LA  - en
PB  - Proceedings of the 46th Annual IEEE Reliability Physics Symposium 2008, Phoenix, AZ
PY  - 2008
TI  - Measurements for the Reliability and Electrical Characterization of Semiconductor Nanowires
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32971
ER  -