Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||James P. Randa; David K. Walker; Lawrence P. Dunleavy; Robert L. Billinger; John Rice;|
|Title:||Characterization of On-Wafer Diode Noise Sources|
|Published:||June 01, 1998|
|Abstract:||A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on-wafer measurements of noise temperature and details the preliminary design and construction of the transfer standards. Measurements are presented of their noise temperatures at frequencies from 8 to 12 GHz. Such transfer standards could be used in interlaboratory comparisons or as a verification tool for checking on-wafer noise calibration.|
|Proceedings:||Tech Dig., Auto. RF Tech. Group Conf.|
|Pages:||pp. 53 - 61|
|Dates:||June 7-12, 1998|
|Keywords:||noise,noise measurement,noise source,on-wafer measurement,noise characterization,noise temperature|
|Research Areas:||Electronics & Telecommunications, Microelectronics, Electromagnetics|
|PDF version:||Click here to retrieve PDF version of paper (62KB)|