@conference{4686,
  author = {James Randa and Dave Walker and Lawrence Dunleavy and Robert Billinger and John Rice},
  title = {Characterization of On-Wafer Diode Noise Sources},
  year = {1998},
  month = {1998-06-01},
  publisher = {Tech Dig.,  Auto. RF Tech. Group Conf., Baltimore, MD},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=27897},
  language = {en},
}