TY  - CONF
AU  - James Randa
AU  - Dave Walker
AU  - Lawrence Dunleavy
AU  - Robert Billinger
AU  - John Rice
C2  - Tech Dig.,  Auto. RF Tech. Group Conf., Baltimore, MD
DA  - 1998-06-01
LA  - en
PB  - Tech Dig.,  Auto. RF Tech. Group Conf., Baltimore, MD
PY  - 1998
TI  - Characterization of On-Wafer Diode Noise Sources
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=27897
ER  -