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Topic Area: Materials Science

Displaying records 461 to 470 of 482 records.
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461. X-Ray Topography Study of Surface Damage in Single-Crystal Sapphire
Topic: Materials Science
Published: 2/9/2000
Authors: David R Black, Robert S. Polvani, Kate Medicus, H E. Burdette
Abstract: X-ray diffraction topography was used to investigate the relationship between sub-surface damage, near-surface microstructure, and fracture strength in a series of sapphire modulus of rupture (MOR) bars which had been fabricated to proof test fabrica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850319

462. Secondary Ferrite Number Reference Materials: Gage Calibration and Assignment of Values
Series: Special Publication (NIST SP)
Report Number: 260-141
Topic: Materials Science
Published: 2/1/2000
Authors: Christopher N McCowan, Thomas Allen Siewert, D P Vigliotti, C M Wang
Abstract: Ferrite Numbers (FN) were assigned to blocks of stainless steel that serve as secondary ferrite reference materials (RM 8480 and 8481), and these specimens were placed in our Reference Materials inventory. These reference materials are used to calib ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851156

463. Structure and Microwave Dielectric Properties in the x Ca^d2^AlNbO^d6^: (1-x) Ca^d3^Nb^d2^O^d8^ System
Topic: Materials Science
Published: 2/1/2000
Authors: Julia Y. Chan, Terrell A Vanderah, Robert S. Roth, Winnie K Wong-Ng, B A Reisner, Richard G. Geyer
Abstract: The structure and dielectric properties of bulk ceramics in the xCa2AlNbO6: (1-x)Ca3Nb2O8 system were studied. Ca2AlNbO6 (P21/n, a = 5.3785(1) , b = 5.4158(1) , c = 7.6259(1) , b = 89.93(1)o) is a double perovskite with structure similar to CaTiO3 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850396

464. Structural investigation of (Sr^d4-{delta}^Ca^d{delta}^)PtO^d6^ Using X-Ray Rietveld Refinement
Topic: Materials Science
Published: 8/16/1999
Authors: Winnie K Wong-Ng, James A Kaduk, R A Young, F Jiang
Abstract: The structures of the solid solution series (Sr^d4-{delta}^Ca^d{delta}^)PtO^d6^, with {delta} = 0, 0.85(1), 2, and 3, have been investigated using the Rietveld refinement technique with laboratory x-ray powder data. A complete solid solution between ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850208

465. The International Institute of Welding: Report on 1998 Actions
Topic: Materials Science
Published: 5/3/1999
Author: Thomas Allen Siewert
Abstract: Commission V covers issues of weld inspection and quality control for the International Institute of Welding (IIW). This report summarizes the information presented at the 1998 Annual Assembly: descriptions of both research and draft ISO standards b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851212

466. Characterization of Ternary Compounds in the BaO:Fe^d2^O^d3^:TiO^d2^ System: Ba^d6^Fe^d45^Ti^d17^O^d106^ and BaFe^d11^Ti^d3^O^d23^
Topic: Materials Science
Published: 1/1/1999
Authors: Terrell A Vanderah, Winnie K Wong-Ng, B H. Toby, V. M. Browning, Robert D Shull, Richard G. Geyer, Robert S. Roth
Abstract: Single crystals of Ba^d6^Fe^d45^Ti^d17^O^d106^ and BaFe^d11^Ti^d3^O^d23^ were obtained as major and minor co-products, respectively, by slow-cooling an off-stoichiometric BaO:Fe^d2^O^d3^:TiO^d2^ melt. The former compound exhibits variable stoichiome ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850204

467. Sample-Angle Feedback for Diffraction Anomalous Fine-Structure Spectroscopy
Topic: Materials Science
Published: 5/1/1998
Authors: J O Cross, W Elam, V G Harris, J P Kirkland, Charles E. Bouldin, L B Sorensen
Abstract: Diffraction anomalous fine-structure (DAFS) experiments measure Bragg peak intensities as continuous functions of photon energy near a core-level excitation. Measuring the integrated intensity at each energy makes the experiments prohibitively slow, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850185

468. X-Ray Diffraction Topography of Sapphire for Windows and Domes
Topic: Materials Science
Published: 3/30/1998
Author: David R Black
Abstract: X-ray diffraction topography has been used as a nondestructive characterization tool to investigate single-crystal sapphire for window and dome applications. A variety of examples are shown that demonstrate the utility of x-ray diffraction imaging a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850182

469. Optimizing Residual Gas Analyzers for Process Monitoring
Topic: Materials Science
Published: 12/1/1997
Author: C R Tilford
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100330

470. The Economics of New-Technology Materials: A Case Study of FRP Bridge Decking
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5864
Topic: Materials Science
Published: 7/1/1996
Authors: M A Ehlen, Harold E. Marshall
Abstract: Many new materials are bing developed from polymers, metals, and ceramics. Industry is beginning to introduce some of these high-performance or new-technology materials in construction and manufacturing applications because the materials have advant ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907922



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