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Displaying records 971 to 980 of 1000 records.
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971. Development of Rockwell Hardness Standards: From Performance Comparisons to Fundamental Metrology
Topic: Manufacturing
Published: 1/1/1995
Authors: J Smith, Jun-Feng Song, F Rudder, Theodore Vincent Vorburger
Abstract: Based on the Rockwell diamond indenter's microform calibrations recently developed at NIST, as well as a deadweight standardized Rockwell hardness machine, the NIST Rockwell hardness standard calibration has been established. Our approach makes i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820768

972. Device Fabrication by Scanned Probe Oxidation
Topic: Manufacturing
Published: 1/1/1995
Author: John A Dagata
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820729

973. Enhanced Machinability of Silicon Carbide via Microstructural Design
Topic: Manufacturing
Published: 1/1/1995
Authors: Nitin P Padture, Christopher J. Evans, Hockin D. Xu, Brian Ronald Lawn
Abstract: The machinability of a heterogeneous silicon carbide with weak interphase boundaries, elongated grains, and high internal stresses is evaluated relative to a homogeneous control material with a well-bonded, equiaxed, and unstressed grain structure. D ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820752

974. Error Compensation for CMM Touch Trigger Probes
Topic: Manufacturing
Published: 1/1/1995
Authors: William Tyler Estler, Steven David Phillips, Bruce R. Borchardt, Ted Hopp, Christoph Johann Witzgall, M Levenson, et al
Abstract: We present the analysis of a simple mechanical model of a common type of kinematic seat touch trigger probe widely used on modem coordinate measuring machines (CMMs). The model provides a quantitative description of the pre-travel variation or probe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820736

975. Fabrication of Optics by Diamond Turning
Topic: Manufacturing
Published: 1/1/1995
Authors: Richard L. Rhorer, Christopher J. Evans
Abstract: The use of special machine tools with single-crystal diamond-cutting tools to produce metal optics is called diamond turning. The manufacture of optical surfaces by diamond turning is relatively new compared to the traditional optical-polishing metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820759

976. Finishing Performance and Wear Mechanisms of Cubic Boron Nitride Tools in Turning Hardness 52100 Steels
Topic: Manufacturing
Published: 1/1/1995
Authors: Y K Chou, M Barash, Christopher J. Evans
Abstract: This study investigated the performance and wear behavior of different cubic boron nitride (CBN) tools in finish turning of hardened 52100 steels. Tool performance was evaluated based on surface finish and flank wear land width. Wear mechanisms of CB ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820728

977. Increasing the Value of Atomic Force Microscopy Process Metrology Using a High-Accuracy Scanner, Tip Characterization, and Morphological Image Analysis
Topic: Manufacturing
Published: 1/1/1995
Authors: J Schneir, John S Villarrubia, T Mcwaid, V W. Tsai, Ronald G Dixson
Abstract: Atomic force microscopes are being used increasingly for process metrology. As a case study, the measurement by atomic force microscope of a soda lime glass optical disk patterned using optical lithography and reactive plasma etching is examined. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820816

978. Interferometer Bandwidth Expanded by Software
Topic: Manufacturing
Published: 1/1/1995
Author: P Sullivan
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820777

979. Measurement and Analysis of Forces in Grinding of Silicon Nitride
Topic: Manufacturing
Published: 1/1/1995
Authors: S Jahanmir, T W. Hwang, Eric Paul Whitenton, S Job, Christopher J. Evans
Abstract: Using an instrumented surface grinder, the two components of grinding forces (normal and tangential) were measured for different types of silicon nitride ceramics. The influences of grinding parameters, such as down feed and table speed, and grinding ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820742

980. Measurement of Patterned Film Linewidth for Interconnect Characterization
Topic: Manufacturing
Published: 1/1/1995
Authors: L Linholm, Robert Allen, Michael W Cresswell, Rathindra Ghoshtagore, S Mayo, H Schafft, John A Kramar
Abstract: The results from high-quality electrical and physical measurements on the same cross-bridge resistor test structure with approximately vertical sidewalls have shown differences in linewidth as great as 90 nm for selected conductive films. These diffe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820744



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