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Topic Area: Optical Metrology

Displaying records 71 to 80 of 117 records.
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71. CCPR-S1 Supplementary Comparison for Spectral Radiance in the range of 220 nm to 2500 nm
Topic: Optical Metrology
Published: 6/2/2009
Authors: Boris Khlevnoy, Victor Sapritsky, Bernard Rougie, Charles E Gibson, Howard W Yoon, Arnold A. Gaertner, Dieter Taubert, Juergen Hartmann
Abstract: In 1997, the Consultative Committee for Photometry and Radiometry (CCPR) initiated a supplementary comparison of spectral radiance in the wavelength range from 220 nm to 2500 nm (CCPR S1) using tungsten -strip filament lamps as transfer standards. Fi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900253

72. Measurement of the ultraviolet-induced fluorescence yield from integrating spheres
Topic: Optical Metrology
Published: 6/2/2009
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
Abstract: We report theory and measurements of a simple and absolute technique for the determination of the total emitted spectral fluorescence yield inside an integrating sphere from the sphere coating under irradiation with a monochromatic beam. This techniq ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842602

73. DMD diffraction measurements to support design of projectors for test and evaluation of multispectral and hyperspectral imaging sensors
Topic: Optical Metrology
Published: 6/1/2009
Authors: Joseph Paul Rice, Jorge Enrique Neira, Michael Kehoe, Rand Swanson
Abstract: We describe our use of Digital Micromirror Devices (DMDs) for the performance testing, characterization, calibration, and system-level data product validation of multispectral and hyperspectral imaging sensors. We have developed a visible Hyperspectr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901172

74. Rapid and precise absolute distance measurements at long range
Topic: Optical Metrology
Published: 6/1/2009
Authors: Ian R Coddington, William C Swann, Ljerka Nenadovic, Nathan Reynolds Newbury
Abstract: The ability to determine absolute distance to an object is one of the most basic measurements of remote sensing. High precision ranging has important applications in both large-scale manufacturing and in future tight formation-flying satellite missio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901111

75. Illuminance responsivity calibration of reference photometers at the NIST SIRCUS and SCF facilities
Topic: Optical Metrology
Published: 5/29/2009
Authors: George P Eppeldauer, Carl C Miller, Thomas C Larason, Yoshihiro Ohno
Abstract: The illuminance responsivities of two transfer standard photometers have been directly determined from their spectral responsivity calibrations at two different calibration facilities of NIST. The main characteristics of the two photometers, and thei ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902807

76. Time and Frequency-Domain Spectroscopy with Dual Frequency Combs
Topic: Optical Metrology
Published: 5/28/2009
Authors: Nathan Reynolds Newbury, Ian R Coddington, William C Swann
Abstract: High-resolution spectroscopic measurements of the amplitude and phase spectra from a gas sample can be acquired by use of dual frequency combs. Here we discuss the corresponding gas signature in the time domain.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901109

77. Absolute Ranging Using Frequency Combs
Topic: Optical Metrology
Published: 5/25/2009
Authors: William C Swann, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We present a technique for measuring absolute range that uses two mismatched frequency combs to measure distance over 1.5 m range with 10 nm level statistical uncertainty.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901110

78. Vibration immune fiber-laser frequency comb based on a polarization-maintaining figure-eight laser
Topic: Optical Metrology
Published: 5/20/2009
Authors: Fabrizio Raphael Giorgetta, Esther Baumann, Jeffrey W. Nicholson, William C Swann, Ian R Coddington, Nathan Reynolds Newbury
Abstract: A frequency comb is phase-locked to a cw laser with an electro-optic-modulator providing 1.6 MHz feedback bandwidth. Residual phase noise is as low as -94 dBc/Hz, and the comb remained locked under mechanical vibration of up to 1.9 g.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901116

79. Quantum radiometry
Topic: Optical Metrology
Published: 5/2/2009
Authors: Sergey V Polyakov, Alan L Migdall
Abstract: We review radiometric techniques that take advantage of photon counting and stem from the quantum laws of nature. We present a brief history of metrological experiments and review the current state of experimental quantum radiometry.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902273

80. Characterization of Metal-Oxide Nanofilm Morphologies and Composition by Terahertz Transmission Spectroscopy
Topic: Optical Metrology
Published: 3/30/2009
Authors: Edwin J Heilweil, James E Maslar, William Andrew Kimes, Nabil Bassim, Peter K. Schenck
Abstract: An all-optical terahertz absorption technique for non-destructive characterization of nanometer-scale metal-oxide thin films grown on silicon substrates is described. Example measurements of laser and atomic layer-deposited films of HfO2, TiO3, Al2O ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842590



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