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Topic Area: Optical Metrology

Displaying records 101 to 110 of 134 records.
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101. An infrared laser-based reflectometer for low reflectance measurements of samples and cavity structures
Topic: Optical Metrology
Published: 9/15/2008
Authors: Leonard M Hanssen, Jinan Zeng
Abstract: An instrument, the Complete Hemispherical Infrared Laser-based Reflectometer (CHILR), has been designed and built for the accurate characterization of the total reflectance of highly absorbing samples and cavity structures down to the level of 10-5 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842545

102. Infrared Absolute Calibrations Down to 10 fW in Low-Temperature Environments at NIST
Topic: Optical Metrology
Published: 7/22/2008
Authors: Adriaan Carl Linus Carter, Raju Vsnu Datla, Timothy Jung, Solomon Woods
Abstract: The Low Background Infrared (LBIR) facility at the National Institute of Standards and Technology (NIST) is responsible for absolute IR radiometric calibrations (SI traceable) in low-background temperature (below 80 K) environments. IR radiometric te ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842510

103. NIST Goniospectrometer for Surface Color Measurements
Topic: Optical Metrology
Published: 7/7/2008
Authors: Maria E Nadal, Gael Obein
Abstract: The goniospectrometer at the National Institute of Standards and Technology (NIST) can measure the spectral reflectance of colored samples over a wide range of illumination and viewing angles. This capability is important for the colorimetric charact ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842549

104. Bilateral optical power meter comparison between NIST and CENAM
Topic: Optical Metrology
Published: 7/1/2008
Authors: Igor Vayshenker, J. Bermudez, J. Molina, Z. Ruiz, David J Livigni, Xiaoyu X. Li, John H Lehman
Abstract: We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Centro Nacional De Metrologia (CENAM-Mexico). Open beam (free field) and optical-fiber-based measurements at wave ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33044

105. Dual-CGH Interferometry Test for X-Ray Mirror Mandrels
Topic: Optical Metrology
Published: 6/15/2008
Authors: Guangjun Gao, John Lehan, Ulf Griesmann
Abstract: We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902515

106. Extraction of trench geometry and linewidth of nanoscale grating targets in (110)-oriented silicon using angle-resolved scatterometry
Topic: Optical Metrology
Published: 6/9/2008
Authors: Heather J Patrick, Thomas Avery Germer, Michael W Cresswell, Bin Li, Huai Huang, Paul S. Ho
Abstract: The extraction of nanoscale dimensions and feature geometry of grating targets using signature-based optical techniques is an area of continued interest in semiconductor manufacturing. In the current work, we have performed angle-resolved scatterome ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842548

107. Characterization of an Optical Time Domain Reflectometer Calibrator
Topic: Optical Metrology
Published: 3/1/2007
Authors: Donald R Larson, Nicholas G Paulter Jr, Kenneth C Blaney
Abstract: We report the results of an investigation into the signal characteristics and behavior of an instrument used to calibrate Optical Time Domain Reflectometers. This instrument implements the Telecommunications Industry Association standard TIA/EIA-455- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32449

108. Introduction to Journal of Modern Optics Special Issue on Single Photon: Sources, Detectors, Applications and Measurement Methods
Topic: Optical Metrology
Published: 1/20/2007
Authors: J Cheung, Alan L Migdall, Stefania Castelletto
Abstract: In October 2005, a 2-day follow up workshop, Single photon: sources, detectors, applications and measurement methods, was held at the NPL (National Physical Laboratory, UK). The focus for this workshop was to report on the key developments since the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841035

109. Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III
Topic: Optical Metrology
Published: 1/1/2007
Authors: Uwe Arp, Charles E Gibson, Keith R Lykke, Albert C Parr, Robert D. Saunders, D J Shin, Ping-Shine Shaw, Zhigang Li, Howard W Yoon
Abstract: A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841022

110. Characterization and Calibration of an Optical Time Domain Reflectometer Calibrator
Topic: Optical Metrology
Published: 8/23/2006
Authors: Donald R Larson, Nicholas G Paulter Jr, Kenneth C Blaney
Abstract: We report the results of an investigation into the signal characteristics and behavior of an instrument used to calibrate Optical Time Domain Reflectometers. This instrument implements the Telecommunications Industry Association standard TIA/EIA-455- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32309



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