NIST logo

Publications Portal

You searched on:
Topic Area: Optical Metrology

Displaying records 101 to 110 of 117 records.
Resort by: Date / Title


101. Comparison of Optical Coherence Tomography, X-Ray Computed Tomography, and Confocal Microscopy Results From an Impact Damaged Epoxy/E-Glass Composite
Topic: Optical Metrology
Published: 1/1/2002
Authors: Joy P Dunkers, D P Sanders, Donald Lee Hunston, M J Everett, William H. Green
Abstract: Optical coherence tomography (OCT) is an emerging technique for imaging of synthetic materials. OCT is attractive because of the combination of its high sensitivity (>90 dB), high resolution ((10-20) mm), and low cost (~$75 k). The value of any new ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851798

102. Non-Destructive Characterization of the Morphology of a Polymer Co-Extruded Scaffold Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 12/19/2001
Authors: Joy P Dunkers, N Washburn, Carl George Simon Jr, Alamgir Karim, Eric J. Amis
Abstract: It is generally understood that a complex interaction of many variables controls the success of cell infiltration, proliferation, and differentiation within a tissue scaffold. One parameter that has a large influence on the development of functionin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851812

103. The Prediction of Permeability for an Epoxy/E-Glass Composite Using Optical Coherence Tomographic Images
Topic: Optical Metrology
Published: 12/1/2001
Authors: Joy P Dunkers, Frederick R Phelan Jr, C G Zimba, Kathleen M. Flynn, D P Sanders, R C Peterson, Richard~undefined~undefined~undefined~undefined~undefined Parnas
Abstract: Knowledge of the permeability tensor in liquid composite molding is important for process optimization. Unfortunately, experimental determination of permeability is difficult and time consuming. A rapid, non-destructive technique called optical coh ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851606

104. Imaging of Multi-Fiber, Micro-Mechanical Testing Specimens Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 2/1/2001
Authors: Joy P Dunkers, Gale Antrus Holmes, Walter G McDonough
Abstract: In this initial work, we interfaced a micro-mechanical testing stage with the optical coherence tomography (OCT) instrument. We then demonstrated the feasibility of this approach by comparing OCT images of single and multi-fiber sample to optical mic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851846

105. The Application of Optical Coherence Tomography to Problems in Polymer Matrix Composites
Topic: Optical Metrology
Published: 1/1/2001
Authors: Joy P Dunkers, Frederick R Phelan Jr, D P Sanders, M J Everett, William H. Green, Donald Lee Hunston, Richard~undefined~undefined~undefined~undefined~undefined Parnas
Abstract: The Composites Group at the National Institute of Standards and Technology has found optical coherence tomography (OCT) to be a powerful tool for non-destructive characterization of polymer matrix composites. Composites often exhibit superior proper ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851711

106. Imaging of Composite Defects and Damage Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 5/1/2000
Authors: Joy P Dunkers, M J Everett, D P Sanders, Donald Lee Hunston
Abstract: The Composites Group at the National Institute of Standards and Technology has found optical coherence tomography (OCT) to be a powerful tool for non-destructive characterization of polymer matrix composites. Composites can be made more cost competi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851700

107. Imaging of Impact Damage in Composites Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 2/1/2000
Authors: Joy P Dunkers, D P Sanders, Donald Lee Hunston, M J Everett
Abstract: Resistance to impact damage is extremely important for most composites. Such damage can initiate delamination, one of the most common failure modes in composites.. Because this is such an important failure mode, many studies have tried to develop ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851666

108. Characterization of Composite Microstructure and Damage Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 1/1/1999
Authors: Joy P Dunkers, C G Zimba, Kathleen M. Flynn, Donald Lee Hunston, R Prasankumar, X Li, J G Fujimoto
Abstract: Optical coherence tomography (OCT) is a non-destructive and non-contact technique that images microstructure within scattering media. In this work, the versatility of OCT for non-destructive evaluation is demonstrated through imaging of composite mi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851542

109. Optical Coherence Tomography of Glass Reinforced Polymer Composites
Topic: Optical Metrology
Published: 1/1/1999
Authors: Joy P Dunkers, Richard~undefined~undefined~undefined~undefined~undefined Parnas, C G Zimba, R C Peterson, Kathleen M. Flynn, J G Fujimoto, B E Bouma
Abstract: Optical coherence tomography (OCT) is a non-destructive and non-contact technique to image microstructure within scattering media. The application of OCT to highly scattering materials such as polymer composites is especially challenging. In this w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851443

110. Prediction of Permeability Using Optical Coherence Tomographic Imaging of an Epoxy and Unidirectional E-Glass Composite
Topic: Optical Metrology
Published: 1/1/1999
Authors: Joy P Dunkers, Frederick R Phelan Jr, C G Zimba, R Prasankumar, J G Fujimoto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853691



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series