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Displaying records 31 to 40 of 350 records.
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31. Pattern Transfer of Hydrogen Depassivation Lithography Patterns into Silicon with Atomically Traceable Placement and Size Control
Topic: Electronics & Telecommunications
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep Narayanan Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915583

32. Effects of Temperature on Surface Accumulation and Release of Silica Nanoparticles in an Epoxy Nanocoating Exposed to UV Radiation
Topic: Electronics & Telecommunications
Published: 6/16/2014
Authors: Chun-Chieh Tien, Ching-Hsuan Chang, Bernard Hao-Chih Liu, Deborah L Stanley, Savelas A Rabb, Lee Lijian Yu, Tinh Nguyen, Li Piin Sung
Abstract: Polymer nanocoatings are increasingly used outdoors and in harsh environments. However, because most common polymers degraded by the weathering elements, nanoparticles in polymer nanocoatings may be released into the environments. Such nanoparticle r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915955

33. 3D Characterization of carbon nanotube polymer composites using Scanning Electron Microscopy and Confocal Raman Microscopy
Topic: Electronics & Telecommunications
Published: 6/11/2014
Authors: Minhua Zhao, Rachel J. Cannara
Abstract: Scanning Electron Microscopy (SEM) and Confocal Raman Microscopy (CRM) were employed to characterize the 3D state of disperison of carbon nanotubes (CNT) in a polymer matrix. First, non-destructive subsurface imaging on CNT-polymer was conducted by c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915822

34. 2D and 3D Topography Comparisons of Toolmarks Produced from Consecutively Manufactured Chisels and Punches.
Topic: Electronics & Telecommunications
Published: 5/20/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Robert Meryln Thompson, John Villanova, Taher Kakal
Abstract: A 2009 report by the National Academies [1] recommended strengthening the scientific basis of procedures and criteria employed by the forensic science specialty of toolmark identification. The current method of comparison and determination of ide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914887

35. DNA-based Nanocomposite Bio-Coatings for Fire Retarding Polyurethane Foam
Topic: Electronics & Telecommunications
Published: 5/2/2014
Authors: Yu-Chin Li, Yeon Seok Kim, John R Shields, Rick D Davis
Abstract: Layer-by-Layer (LbL) assembled multilayer thin films of deoxyribonucleic acid (DNA), chitosan (CHI), and montmorillonite (MMT), were studied in an effort to produce fully renewable, bio-based fire retardant coatings for flexible polyurethane foam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915517

36. A Quantitative Study of Nanoparticle Release from Nanocoatings Exposed to UV Radiation
Topic: Electronics & Telecommunications
Published: 4/7/2014
Authors: Li Piin Sung, Deborah L Stanley, Justin M Gorham, Savelas A Rabb, Xiaohong Gu, Lee Lijian Yu, Tinh Nguyen
Abstract: Nanoparticles are increasingly used in polymer coatings (i.e., nanocoatings) to improve multiple properties of traditional coatings such as mechanical, electrical, gas barrier, and UV resistance. These high performance nanocoatings are often used in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915497

37. Optical volumetric inspection of sub-20 nm patterned defects with wafer noise
Topic: Electronics & Telecommunications
Published: 4/2/2014
Authors: Bryan M Barnes, Francois R. Goasmat, Martin Y Sohn, Hui Zhou, Richard M Silver, Andras Vladar, Abraham Arceo
Abstract: We have previously introduced a new data analysis method that more thoroughly utilizes scattered optical intensity data collected during defect inspection using bright-field microscopy. This volumetric approach allows conversion of focus resolved 2-D ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915807

38. Controlled Formation and Characterization of Dithiothreitol-Conjugated Gold Nanoparticle Clusters
Topic: Electronics & Telecommunications
Published: 3/5/2014
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Justin M Gorham, Jiwen Zheng, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: We report a systematic study of the controlled formation of discrete-size gold nanoparticle clusters (GNCs) by interaction with the reducing agent dithiothreitol (DTT). Asymmetric-flow field flow fractionation and electrospray differential mobility a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915014

39. A four-pixel single-photon pulse-position array fabricated from WSi superconducting nanowire single- photon detectors
Topic: Electronics & Telecommunications
Published: 2/3/2014
Authors: Varun Boehm Verma, Robert D Horansky, Francesco Marsili, Jeffrey Stern, Matthew Shaw, Adriana E Lita, Richard P Mirin, Sae Woo Nam
Abstract: We demonstrate a scalable readout scheme for an infrared single-photon pulse-position camera consisting of WSi superconducting nanowire single-photon detectors. For an N {multiply} N array, only 2 {multiply} N wires are required to obtain the pos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914494

40. Applications of Surface Metrology in Firearm Identification
Topic: Electronics & Telecommunications
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. Toolmarks are created when a tool comes into contact with a surface an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914401



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