NIST logo

Publications Portal

You searched on: Topic Area: Electronics Telecommunications Sorted by: date

Displaying records 31 to 40 of 320 records.
Resort by: Date / Title


31. Micro/nano-wear studies on epoxy/silica nanocomposites
Topic: Electronics & Telecommunications
Published: 4/18/2013
Authors: Zhengzhi Wang, Ping Gu, Xiao-ping Wu, Zhong Zhang, Martin Y Chiang, Hui Zhang
Abstract: We proposed a new method for quantifying the micro/nano-scale wear volume (i.e., volume of wear loss) in a test to characterize the wear-resistance of nanocomposites. Effects of wear load and pass (a pattern of scan cycles), and nanoparticle content ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913149

32. Block-copolymer healing of simple defects in a chemoepitaxial template
Topic: Electronics & Telecommunications
Published: 4/11/2013
Authors: Paul N. Patrone, Gregg M. Gallatin
Abstract: Using a phase-field model of block copolymers (BCPs), we characterize how a chemoepitaxial template with parallel lines of arbitrary width affects the BCP microdomain shape. The model, which is an extension of the Leibler-Ohta-Kawasaki theory, accoun ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913545

33. The evaluation of photo/e-beam complementary grayscale lithography for high topography 3D structure
Topic: Electronics & Telecommunications
Published: 3/29/2013
Authors: Liya Yu, Richard J Kasica, Robert Dennis Newby, Lei Chen, Vincent K Luciani
Abstract: This article demonstrates and evaluates photo/e-beam grayscale complementary lithography processes for the fabrication of large area, high topography grayscale structure. The combination of these two techniques capitalizes on the capability of photol ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913677

34. Polymer chain dynamics in weakly intercalated polymer/nanoplatelet mixtures
Topic: Electronics & Telecommunications
Published: 3/15/2013
Authors: Kevin A. Masser, Hongyi Yuan, Chad R Snyder, Alamgir Karim
Abstract: The dynamics of two chemically similar type-A polymers, poly(epsilon-caprolactone) (PCL) and poly(lactic acid) (PLA) with small amounts of Cloisite 30B nanoplatelets were investigated via broadband dielectric relaxation spectroscopy. The termina ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912071

35. Does 47 Days of Decay Change Persistent Organic Pollutants in Loggerhead Sea Turtle Eggs?
Topic: Electronics & Telecommunications
Published: 1/18/2013
Author: Jennifer M Lynch
Abstract: Reptile and bird eggs are priority samples for specimen banking programs that assess spatial and temporal trends of environmental contaminants. From endangered species, such as sea turtles, non-lethal sampling is required, like collecting unhatched ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911286

36. An imaging spectrometer based on high resolution microscopy of fluorescent aluminum oxide
Topic: Electronics & Telecommunications
Published: 1/14/2013
Authors: James A. Bartz, Cynthia J Zeissler, V. V. Fomenko, Mark S. Akselrod
Abstract: Fluorescent Nuclear Track Detector (FNTD) technology was tested as an imaging and spectroscopic tool for radionuclide analysis. This investigation intended to distinguish between characteristic α-particles of 239Pu (5.2 MeV), 234U (4.8 MeV) and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912708

37. Observation of Interface/Near Interface Defects in 4H SiC MOSFETs With a New Electrically Detected Magnetic Resonance Technique
Topic: Electronics & Telecommunications
Published: 1/1/2013
Authors: Jason T Ryan, Brad Bittel, Pat Lenahan, Jody Fronheiser, Aivars Lelis
Abstract: We study 4H SiC MOSFETs with a new electrically detected magnetic resonance technique (EDMR) we call spin dependent charge pumping (SDCP). Our SDCP results demonstrate a tremendous improvement in sensitivity over other EDMR techniques. Addition ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912340

38. NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications
Series: Handbook (NIST HB)
Report Number: 150-11
Topic: Electronics & Telecommunications
Published: 12/21/2012
Authors: Bethany E Hackett, Bradley W Moore, Dennis G. Camell
Abstract: NIST Handbook 150-11, NVLAP Electromagnetic Compatibility and Telecommunications, presents the technical requirements and guidance for the accreditation of laboratories under the NVLAP Electromagnetic Compatibility and Telecommunications (ECT) LAP. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911647

39. Third-Round Report of the SHA-3 Cryptographic Hash Algorithm Competition
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7896
Topic: Electronics & Telecommunications
Published: 11/15/2012
Authors: Shu-jen H Chang, Ray A Perlner, William Edward Burr, Meltem Sonmez Turan, John M Kelsey, Souradyuti Paul, Lawrence E Bassham
Abstract: The National Institute of Standards and Technology (NIST) opened a public competition on November 2, 2007 to develop a new cryptographic hash algorithm - SHA-3, which will augment the hash algorithms specified in the Federal Information Processing St ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912724

40. Temperature-dependent mechanical-resonance frequencies and damping in ensembles of gallium nitride nanowires
Topic: Electronics & Telecommunications
Published: 10/22/2012
Authors: Kristine A Bertness, Norman A Sanford, J. R. Montague, H.S. Park, Victor M. Bright, C. T. Rogers
Abstract: We have measured singly clamped cantilever mechanical-resonances in ensembles of as-grown gallium nitridenanowires (GaN NWs), from 12 K to 320 K. Resonance frequencies are approximately linearly dependent on temperature near 300 K ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910038



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series