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Displaying records 1 to 10 of 722 records.
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1. Dietary Supplement Laboratory Quality Assurance Program: Exercise J Final Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7997
Topic: Electronics & Telecommunications
Published: 4/16/2014
Authors: Laura J Wood, Melissa Meaney Phillips, Catherine A Rimmer, Mary Bedner, Kaitlyn Chieh, Rick L Paul
Abstract: The NIST Dietary Supplement Laboratory Quality Assurance Program (DSQAP) was established in collaboration with the National Institutes of Health (NIH) Office of Dietary Supplements (ODS) in 2007 to enable members of the dietary supplements community ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915594

2. A Quantitative Study of Nanoparticle Release from Nanocoatings Exposed to UV Radiation
Topic: Electronics & Telecommunications
Published: 4/7/2014
Authors: Li Piin Sung, Deborah L Stanley, Justin M Gorham, Savelas A Rabb, Xiaohong Gu, Lee Lijian Yu, Tinh Nguyen
Abstract: Nanoparticles are increasingly used in polymer coatings (i.e., nanocoatings) to improve multiple properties of traditional coatings such as mechanical, electrical, gas barrier, and UV resistance. These high performance nanocoatings are often used in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915497

3. Optical volumetric inspection of sub-20 nm patterned defects with wafer noise
Topic: Electronics & Telecommunications
Published: 4/2/2014
Authors: Bryan M Barnes, Francois R. (Francois) Goasmat, Martin Y Sohn, Hui Zhou, Richard M Silver, Andras Vladar, Abraham Arceo
Abstract: We have previously introduced a new data analysis method that more thoroughly utilizes scattered optical intensity data collected during defect inspection using bright-field microscopy. This volumetric approach allows conversion of focus resolved 2-D ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915807

4. Applications of Surface Metrology in Firearm Identification
Topic: Electronics & Telecommunications
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. Toolmarks are created when a tool comes into contact with a surface an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914401

5. Certification of Elements in and Use of Standard Reference Material 3280 Multivitamin/Multielement Tablets
Topic: Electronics & Telecommunications
Published: 12/2/2013
Authors: Gregory C Turk, Katherine E Sharpless, Steven J Christopher, Danielle Cleveland, Russell D Day, Stephen E Long, Elizabeth A Mackey, Anthony F Marlow, Rick L Paul, John R Sieber, Rabia Oflaz, Laura J Wood, Lee Lijian Yu, Rolf Louis Zeisler, Stephen A Wise, James H Yen, E. Greene, J. Harnly, I-P Ho, Joseph M Betz, R. Q. Thompson, Candace Jongsma
Abstract: Standard Reference Material (SRM) 3280 Multivitamin/Multielement Tablets was issued by the National Institute of Standards and Technology (NIST) in 2009 and has certified and reference mass fraction values for 13 vitamins, 26 elements, and 2 caroteno ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912503

6. Does Your SEM Really Tell the Truth? Part 2
Topic: Electronics & Telecommunications
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar, Premsagar Purushotham Kavuri
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become indispensable for many and diverse scientific and industrial applications. The first paper in this series, discussed some of the issues related to signal generat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913866

7. Multi-Walled Carbon Nanotube Layer-by-Layer Coatings With a Novel Trilayer Structure to Reduce Foam Flammability
Topic: Electronics & Telecommunications
Published: 10/29/2013
Authors: Rick D Davis, Yeon Seok Kim, Amanda A Cain, Jaime C. Grunlan
Abstract: The research presented here is the first report of fabricating multi-walled carbon nanotube (MWCNT) based thin coatings on polyurethane foam (PUF) using Layer-by-Layer assembly, and using MWCNTs to reduce the flammability of PUF. The (440.6 ± 47.1) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907032

8. Strong Casimir force reduction by metallic surface nanostructuring
Topic: Electronics & Telecommunications
Published: 9/27/2013
Authors: Francesco Intravaia, Stefan T. Koev, Il Woong Jung, Albert A. Talin, Paul S Davids, Ricardo Decca, Vladimir A Aksyuk, Diego A. R. Dalvit, Daniel Lopez
Abstract: The Casimir force is a quantum-mechanical interaction arising from vacuum fluctuations of the electromagnetic (EM) field and is technologically significant in micro- and nanomechanical systems. Despite rapid progress in nanophotonics, the goal of e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910133

9. Fabrication and characterization of nanostructured III-V thermoelectric materials
Topic: Electronics & Telecommunications
Published: 9/26/2013
Authors: Clint Joseph Novotny, Fred Sharifi
Abstract: Approximately two thirds of all fossil fuel used is lost as heat. Thermoelectric materials, which convert heat into electrical energy, may provide a solution to partially recover some of this lost energy. To date, most commercial thermoelectric mater ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914496

10. 10 TOhm and 100 TOhm High Resistance Measurements at NIST
Topic: Electronics & Telecommunications
Published: 9/25/2013
Authors: Dean G Jarrett, Marlin E Kraft
Abstract: The measurement techniques, standards, and bridges used to calibrate standard resistors in the 10 TΩ to 100TΩ range at NIST are described. Standard resistors, guarded Hamon transfer standard, and 10:1 and 100:1 bridge ratios, were used t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913673



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