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1. Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications
Series: Special Publication (NIST SP)
Report Number: 1200-8
Topic: Electronics & Telecommunications
Published: 1/26/2015
Authors: Justin M Gorham, Karen E Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe Stan, Thao Minh Nguyen, Richard D Holbrook, Michael R Winchester, Robert Francis Cook, Robert MacCuspie, Vincent A Hackley
Abstract: FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916567

2. Effect of Heterogeneity in Nano-TiO2 Filled Acrylic Urethane Coatings on Surface Degradation under Accelerated UV Exposure
Topic: Electronics & Telecommunications
Published: 10/30/2014
Authors: Yongyan Pang, Stephanie S Watson, Li Piin Sung
Abstract: The objective of this study was to investigate how the heterogeneity due to nanoparticle dispersion of polymeric coatings affects surface morphological changes during ultraviolet (UV) exposure under different weathering conditions. Three types of nan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909005

3. Parameter Estimation and Uncertainty Evaluation in a Low Rician K-Factor Reverberation-Chamber Environment
Topic: Electronics & Telecommunications
Published: 10/15/2014
Authors: Chih-Ming Wang, Catherine A Remley, Ansgar T. Kirk, Ryan J. Pirkl, Christopher L Holloway, Dylan F Williams, Paul D Hale
Abstract: In this paper we study statistical methods for estimating the Rician K-factor when this parameter is small. A fiducial approach for making statistical inference on the K-factor is discussed. The approach requires a Monte Carlo method to compute the u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914638

4. NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 3.0
Series: Special Publication (NIST SP)
Report Number: 1108r3
Topic: Electronics & Telecommunications
Published: 10/1/2014
Authors: Christopher Greer, David A Wollman, Dean Eldon Prochaska, Paul A Boynton, Jeffrey A. Mazer, Cuong T Nguyen, Gerald J FitzPatrick, Thomas L Nelson, Galen H Koepke, Allen R Hefner Jr, Victoria Y Pillitteri, Tanya L Brewer, Nada T Golmie, David H Su, Allan C Eustis, David G Holmberg, Steven T Bushby
Abstract: Section 1305 of the Energy Independence and Security Act (EISA) of 2007 (Pub. L. 110‹140) directs NIST ,,to coordinate the development of a framework that includes protocols and model standards for information management to achieve interoperabili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916755

5. Reliability of Low Temperature Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
Topic: Electronics & Telecommunications
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Aric Warner Sanders, Alexandra E Curtin, R. Ishihara, David Thomas Read
Abstract: In this extended abstract we present our recent results on the reliability testing of multi-wall carbon nanotube vertical interconnects (vias).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915382

6. Polyelectrolyte Multilayers in Microfluidic Systems for Biological Applications
Topic: Electronics & Telecommunications
Published: 7/31/2014
Authors: Saugandhika Sarma Minnikanti, Aveek Gangopadhyay, Darwin R Reyes-Hernandez
Abstract: The formation of polyelectrolyte multilayers (PEMs) for the first time two decades ago demonstrating the assembly on charged substrates in a very simple and efficient way have proven to be a reliable method to obtain structures tunable at the nanomet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916103

7. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Electronics & Telecommunications
Published: 7/23/2014
Authors: Nathan Daniel Orloff, Jan Obrzut, Christian John Long, Thomas Fung Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

8. Nanoparticle Released from Consumer Products: Flooring Nanocoatings and Interior Nanopaints
Series: Technical Note (NIST TN)
Report Number: 1835
Topic: Electronics & Telecommunications
Published: 7/21/2014
Authors: Li Piin Sung, Tinh Nguyen, Andrew Keith Persily
Abstract: Nanoparticles are increasingly incorporated in flooring coatings and interior paints to improve their abrasion and microbial resistance. One particular concern of this application is the release of nanoparticles from these surfaces due to repeated m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914979

9. Pattern Transfer of Hydrogen Depassivation Lithography Patterns into Silicon with Atomically Traceable Placement and Size Control
Topic: Electronics & Telecommunications
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep Narayanan Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915583

10. Dominant Thermal Boundary Resistance in Multi-Walled Carbon Nanotube Bundles Fabricated at Low Temperatures
Topic: Electronics & Telecommunications
Published: 7/11/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Sarbajit Banerjee, Kees Beenakker, R. Ishihara
Abstract: While carbon nanotubes (CNT) have been suggested as thermal management mate- rial for integrated circuits, the thermal properties and especially the thermal bound- ary resistance (TBR) of as-grown CNT have hardly been investigated. Here the therma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915307



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Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series