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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 41 to 50 of 211 records.
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41. General Analysis of Microwave Network Scattering Parameters for Characterization of Thin Film Material
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/21/2013
Author: Jan Obrzut
Abstract: A general solution of the linear passive microwave network is presented, for the characterization of thin film materials at high microwave frequencies. The mathematical formulas that correlate scattering parameters S11 and S21 with the distributed ci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910675

42. ,Just Add WaterŠ ‹ ,InstantŠ singly-dispersed suspensions of silver nanoparticles on demand.
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/20/2013
Author: Robert I. MacCuspie
Abstract: The intrinsic instability of silver nanoparticles (AgNPs) is a substantial challenge to achieving stable long-term storage for on-demand use of AgNPs. Here, a ,Just Add WaterŠ approach is presented for achieving suspensions of principally singly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913470

43. Optimizing Instrument Operation and Data Processing for Single Particle Inductively Coupled Plasma Mass Spectrometry Measurement of Gold Nanoparticles
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/16/2013
Authors: Jingyu Liu, Karen E Murphy, Robert I. MacCuspie, Michael R Winchester
Abstract: Inductively coupled plasma mass spectrometry (ICP-MS) operated in single particle mode is an attractive analytical tool capable of both sizing and counting metal containing nanoparticles in aqueous suspensions. In this study, we have evaluated the pe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913478

44. Surface Chemical Transformations of UV irradiated Silica-Epoxy Nanocomposites
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/15/2013
Authors: Justin M Gorham, Tinh Nguyen, Deborah L Stanley, Coralie Bernard, Richard D Holbrook
Abstract: Silica nanoparticles (SiNPs) incorporated into a polymeric matrix, or silica nanocomposites (SiNCs), are used in a wide variety of commercially available products in numerous natural and artificial environments. Environmental factors, such as light, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913534

45. Quantitative Analysis of Dendron-Conjugated Cisplatin-Complexed Gold Nanoparticles Using Scanning Particle Mobility Mass Spectrometry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/8/2013
Authors: De-Hao D. Tsai, Tae Joon Cho, Sherrie R. Elzey, Julien C. Gigault, Vincent A Hackley
Abstract: We report a high-resolution and traceable method to quantify the drug loading on nanoparticle-based cancer therapeutics, and demonstrate this method using a model cisplatin functionalized dendron-gold nanoparticle (AuNP) conjugate. Electrospray diffe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912782

46. Microwave Conductance of Semicontinuous Metallic Films from Coplanar Waveguide Scattering Parameters
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/6/2013
Authors: Jan Obrzut, Oleg A Kirillov
Abstract: Conductance of thin semicontinuous metallic films is measured in coplanar waveguide configuration at frequencies of 100 MHz to 20 GHz. The presented model of the microwave network correlates the experimental scattering parameters (S11) and (S21) with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912337

47. Surface-Engineered Nanomaterials as X-ray Absorbing Adjuvant Agents for Auger-Mediated Chemo-Radiation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/30/2013
Authors: Robert Francis Cook, Sang-Min Lee, De-Hao D. Tsai, Vincent A Hackley, Martin W. Brechbiel
Abstract: We demonstrate a prototype approach to formulate gold nanoparticle (AuNP)‹based X‹ray absorbing adjuvant agents through surface‹engineering of cisplatin pharmacophore (PtII) with lipoic acid‹modified polyacrylate (denoted as PtII‹AuNPs). Design of Pt ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911911

48. TSV Reveal height and bump dimension metrology by the TSOM method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/30/2013
Authors: Ravikiran Attota, Haesung Park, Victor Vartanian, Ndubuisi George Orji, Richard A Allen
Abstract: Through-focus scanning optical microscopy (TSOM) transforms conventional optical microscopes into truly 3D metrology tools for nanoscale- to- microscale dimensional analysis with nanometer-scale sensitivity. Although not a resolution enhancement meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913667

49. Use of TSOM for sub-11 nm node pattern defect detection and HAR features
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/30/2013
Authors: Ravikiran Attota, Abraham Arceo, Bunday Benjamin
Abstract: In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. In defect inspection, conventional bright field techniques will not likely ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913698

50. Enhancing 9 nm Node Dense Patterned Defect Optical Inspection using Polarization, Angle, and Focus
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/10/2013
Authors: Bryan M Barnes, Francois R. Goasmat, Martin Y Sohn, Hui H. Zhou, Abraham Arceo
Abstract: To measure the new SEMATECH 9 nm node Intentional Defect Array (IDA) and subsequent small, complex defects, a methodology has been used to exploit the rich information content generated when simulating or acquiring several images of sub-wavelength-si ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913542



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