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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 41 to 50 of 162 records.
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41. Reliability of Low Temperature Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Aric Warner Sanders, Alexandra E Curtin, R. Ishihara, David Thomas Read
Abstract: In this extended abstract we present our recent results on the reliability testing of multi-wall carbon nanotube vertical interconnects (vias).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915382

42. Attachment of a Reduction-Oxidative Active Diruthenium Compound to Au and Si Surfaces by ,ClickŠ Chemistry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/10/2014
Authors: Sujitra Jeanie Pookpanratana, Joseph William Robertson, Curt A Richter, Christina Ann Hacker, Lee J Richter, Julia Savchenko, Steven Cummings, Tong Ren
Abstract: We report the formation of molecular monolayers containing redox-active diruthenium(II,III) compound to gold and silicon surfaces via ,clickŠ chemistry. The use of Cu-catalyzed azide-alkyne cycloaddition enables modular design of molecular surfa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914145

43. Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/29/2014
Authors: Ravikiran Attota, Ronald G Dixson
Abstract: We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 3-D optical data using th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908543

44. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian J Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

45. High-speed, high-purity separation of gold nanoparticle‹DNA origami constructs using centrifugation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Seung H. Ko, Luis Fernando Vargas Lara, Paul N Patrone, Samuel M Stavis, Francis W Starr, Jack F Douglas, James Alexander Liddle
Abstract: DNA origami is a powerful platform for assembling gold nanoparticle constructs, an important class of nanostructure with numerous applications. Such constructs are assembled by the association of complementary DNA oligomers. These association reactio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915009

46. Pattern Transfer of Hydrogen Depassivation Lithography Patterns into Silicon with Atomically Traceable Placement and Size Control
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep Narayanan Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915583

47. A Study of Nanosilica Release From ,WeatheredŠ Polymer Nanocomposites at Different Temperatures Using ICP-OES
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/15/2014
Authors: Savelas A Rabb, Deborah L Stanley, Li Piin Sung, Tinh Nguyen, Lee Lijian Yu
Abstract: The impact of nanoparticles on the environment and, more importantly, the human population has been of great interest for the past few years. Release of these nanoparticles from different materials from wear or climate exposure has been explored to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916018

48. 3D Characterization of carbon nanotube polymer composites using Scanning Electron Microscopy and Confocal Raman Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/11/2014
Authors: Minhua Zhao, Rachel J. Cannara
Abstract: Scanning Electron Microscopy (SEM) and Confocal Raman Microscopy (CRM) were employed to characterize the 3D state of disperison of carbon nanotubes (CNT) in a polymer matrix. First, non-destructive subsurface imaging on CNT-polymer was conducted by c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915822

49. Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/15/2014
Authors: Jan Obrzut, Nathan D Orloff, Oleg A Kirillov
Abstract: A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914908

50. Single molecule confocal fluorescence lifetime correlation spectroscopy for accurate nanoparticle size determination
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/15/2014
Authors: Bonghwan B. Chon, Kimberly A Briggman, Jeeseong Hwang
Abstract: We report on an experimental procedure in confocal single molecule fluorescence lifetime correlation spectroscopy (FLCS) to determine the range of excitation power and molecule concentration in solution under which the application of an unmodified ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914381



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