NIST logo

Publications Portal

You searched on:
Topic Area: Nanomaterials

Displaying records 131 to 140 of 147 records.
Resort by: Date / Title


131. Real Time Shape Evolution of Nanoimprinted Polymer Structures During Thermal Annealing
Topic: Nanomaterials
Published: 7/18/2006
Authors: Ronald Leland Jones, T Hu, Christopher L Soles, Eric K Lin, R M Reano, Stella W Pang, D M Casa
Abstract: The real time shape of nanoimprinted polymer patterns are measured as a function of annealing temperature and time using a new metrology technique, Critical Dimension Small Angle X-ray Scattering (CD-SAXS). Periodicity, linewidth, line height, and s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852413

132. Mapping substrate/film adhesion with contact-resonance-frequency AFM
Topic: Nanomaterials
Published: 7/12/2006
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Eric Langlois, Tony B. Kos, Nicholas Barbosa
Abstract: We demonstrate contact-resonance-frequency atomic force microscopy (AFM) techniques to nondestructively image variations in adhesion at a substrate/film interface. Contact-resonance-frequency imaging is a dynamic AFM technique to measure the contact ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50316

133. Effect of Self-Assembled Monolayer Film Order on Nanofriction
Topic: Nanomaterials
Published: 7/6/2006
Authors: S Sambasivan, S Hsieh, Daniel A Fischer, Stephen M. Hsu
Abstract: Friction at the nanoscale has become a significant challenge for microsystems, including MEMS, NEMS and other devices. At nanoscale, lateral loading often causes component breakage and loss of functions in devices, therefore, accurate measurement and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851049

134. Mesoporous nanoparticle TiO2 thin films for conductometric gas sensing on microhotplate plateforms
Topic: Nanomaterials
Published: 1/1/2006
Authors: Kurt D Benkstein, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901925

135. Multiscale Modeling of Germanium Quantum Dots in Silicon
Topic: Nanomaterials
Published: 12/30/2005
Authors: Vinod K Tewary, David Thomas Read
Abstract: A method is described for multiscale modeling of a quantum dot in a semiconductor containing a free surface. The method is based upon the use of the lattice-statics and continuum Green's functions integrated with classical molecular dynamics. It full ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50077

136. Acoustic Modes and Elastic Properties of Polymeric Nanostructures
Topic: Nanomaterials
Published: 10/21/2005
Authors: R Hartschuh, A Kisliuk, V N Novikov, Alexei Sokolov, Paul R Heyliger, Colm Flannery, Ward L Johnson, Christopher L Soles, Wen-Li Wu
Abstract: Fabricating mechanically robust polymer structures with nanoscale dimensions is critical for a wide range of emerging technologies. The rigidity of such structures is expected to change as the feature sizes approach the characteristic dimensions of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852462

137. Brillouin light scattering from pumped uniform-precession and low-k magnons in Ni81Fe19
Topic: Nanomaterials
Published: 3/4/2005
Authors: Ward L Johnson, Sudook A Kim, Stephen E Russek, Pavel Kabos
Abstract: A method is presented for performing Brillouin-light-scattering measurements on uniform-precession and low-wave-number (Iow-k) magnons excited by a microwave magnetic field in opaque magnetic specimens. The optical configuration is similar to that e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50065

138. Multiscale Green's Function Modeling of Defects in a Semi-Infinite Silicon Substrate
Topic: Nanomaterials
Published: 3/3/2005
Authors: B. Yang, Vinod K Tewary
Abstract: We have developed a Green's function (GF) based multiscale modeling of defects in a semi-infinite Si-substrate. Point defects and substrate surface (i.e., extended defect) at two different scales are modeled in a unified manner. Behaviors of the poin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50032

139. Development of Multilayer Analyzer Array Detectors for X-ray Fluorescence at the Third Generation Synchrotron Source
Topic: Nanomaterials
Published: 8/5/2004
Authors: Z M Zhang, G Rosenbaum, Q Liu, Daniel A Fischer
Abstract: It is a natural to use multilayer analyzers as energy resolving x-ray fluorescence detection in the lower energy region to use multilayer analyzers. The analyzer array detectors can afford large detection solid angle, superb energy resolution, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851001

140. Structure and Magnetic Properties of Electrodeposition Co on n-GaAs (001)
Topic: Nanomaterials
Published: 9/19/2003
Authors: A X Ford, John E Bonevich, Robert D McMichael, Mark D Vaudin, Thomas P Moffat
Abstract: Co thin films have been electrodeposited on n-type (001) GaAs. The structure and texture of the films were investigated using x-ray diffraction (XRD) and transmission electron microscopy (TEM) while the magnetic properties were examined using a vibr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853237



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series