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Topic Area: Nanomaterials

Displaying records 131 to 140 of 152 records.
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131. Traceable Micro-Force Calibration for Instrumented Indentation Testing
Topic: Nanomaterials
Published: 2/13/2007
Authors: Douglas T Smith, Gordon Allan Shaw, Richard Seugling, Jon Robert Pratt, Dan Xiang
Abstract: We describe the development, performance and application of an accurate SI-traceable force calibration and verification system for potential use in the field calibration of commercial instrumented indentation testing (IIT) instruments. The system co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854482

132. Theory of nuclear resonant inelastic scattering from 57Fe in a single-walled carbon nanotube
Topic: Nanomaterials
Published: 1/1/2007
Author: Vinod K Tewary
Abstract: Line shapes of one phonon lines are calculated in the nuclear resonant inelastic X-ray scattering (NRIXS) from 57Fe embedded in a single-walled carbon nanotube using a computationally efficient phonon Green's function method which is also applicable ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50481

133. Evidence for Internal Stresses Induced by Nanoimprint Lithography
Topic: Nanomaterials
Published: 11/30/2006
Authors: Hyun W. Ro, Yifu Ding, Hae-Jeong Lee, Daniel R. Hines, Ronald Leland Jones, Eric K Lin, Alamgir Karim, Wen-Li Wu, Christopher L Soles
Abstract: The thermal embossing form of nanoimprint lithography is used to pattern arrays of nanostructures into several different polymer films. The shape of the imprinted patterns is characterized with nm precision using both X-ray scattering and reflectivi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852638

134. Efficient Green?s Function Modeling of Line and Surface Defects in Multilayered Anisotropic Elastic and Piezoelectric Material
Topic: Nanomaterials
Published: 10/31/2006
Authors: B. Yang, Vinod K Tewary
Abstract: Green?s function (GF) modeling of defects may take effect only if the GF as well as its various integrals over a line, a surface and/or a small volume can be efficiently evaluated. The GF itself is needed in modeling a point defect while the integral ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50399

135. Comparative Measures of Single Wall Carbon Nanotube Dispersion
Topic: Nanomaterials
Published: 9/14/2006
Authors: Jeffrey A Fagan, Brian Landi, Idan Mandelbaum, Vardhan Bajpai, Barry J. Bauer, Kalman D Migler, Jeffrey Ray Simpson, Angela R Hight Walker, Ryan Raffaelle, Erik K. Hobbie
Abstract: Model polymer composites of DNA wrapped single-wall carbon nanotubes (SWNTs) dispersed in polyacrylic acid are used for a systematic comparison of the different metrologies currently used to evaluate SWNT dispersion. Application of a pH-controlled v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852660

136. Real Time Shape Evolution of Nanoimprinted Polymer Structures During Thermal Annealing
Topic: Nanomaterials
Published: 7/18/2006
Authors: Ronald Leland Jones, T Hu, Christopher L Soles, Eric K Lin, R M Reano, Stella W Pang, D M Casa
Abstract: The real time shape of nanoimprinted polymer patterns are measured as a function of annealing temperature and time using a new metrology technique, Critical Dimension Small Angle X-ray Scattering (CD-SAXS). Periodicity, linewidth, line height, and s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852413

137. Mapping substrate/film adhesion with contact-resonance-frequency AFM
Topic: Nanomaterials
Published: 7/12/2006
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Eric Langlois, Tony B. Kos, Nicholas Barbosa
Abstract: We demonstrate contact-resonance-frequency atomic force microscopy (AFM) techniques to nondestructively image variations in adhesion at a substrate/film interface. Contact-resonance-frequency imaging is a dynamic AFM technique to measure the contact ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50316

138. Effect of Self-Assembled Monolayer Film Order on Nanofriction
Topic: Nanomaterials
Published: 7/6/2006
Authors: S Sambasivan, S Hsieh, Daniel A Fischer, Stephen M. Hsu
Abstract: Friction at the nanoscale has become a significant challenge for microsystems, including MEMS, NEMS and other devices. At nanoscale, lateral loading often causes component breakage and loss of functions in devices, therefore, accurate measurement and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851049

139. Mesoporous nanoparticle TiO2 thin films for conductometric gas sensing on microhotplate plateforms
Topic: Nanomaterials
Published: 1/1/2006
Authors: Kurt D Benkstein, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901925

140. Multiscale Modeling of Germanium Quantum Dots in Silicon
Topic: Nanomaterials
Published: 12/30/2005
Authors: Vinod K Tewary, David Thomas Read
Abstract: A method is described for multiscale modeling of a quantum dot in a semiconductor containing a free surface. The method is based upon the use of the lattice-statics and continuum Green's functions integrated with classical molecular dynamics. It full ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50077



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