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You searched on: Topic Area: Nanomaterials

Displaying records 131 to 140 of 158 records.
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131. Multiscale modeling of point defects in strained silicon
Topic: Nanomaterials
Published: 12/31/2007
Authors: Vinod K Tewary, B. Yang
Abstract: A multiscale Green's function method is described for modeling substitutional point defects and vacancies in strained silicon. The model seamlessly links the length scales from atomistic to macro. The model accounts for the discrete lattice effects, ...

132. Relaxation Behavior of Polymer Structures Fabricated by Nanoimprint Lithography
Topic: Nanomaterials
Published: 8/14/2007
Authors: Yifu Ding, Hyun Wook Ro, Thomas Avery Germer, Jack F Douglas, Brian C. Okerberg, Alamgir Karim, Christopher L Soles
Abstract: We study the decay of the imprinted polystyrene (PS) patterns under thermal annealing using light diffraction. The first order diffraction intensity from the imprinted gratings was measured as a function of annealing time. Local intensity maximum i ...

133. Relationship between dispersion metric and properties of PMMA/SWNT nanocomposites
Topic: Nanomaterials
Published: 6/13/2007
Authors: Takashi Kashiwagi, Jeffrey A Fagan, Jack F Douglas, Kazuya Yamamoto, Nathanael A Heckert, Stefan D Leigh, Jan Obrzut, Fangming Du, Minfang Mu, Sheng Lin-Gibson, K Winey, R Haggenmueller
Abstract: Particle spatial dispersion is a crucial characteristic of polymer composite materials and this property is recognized as especially important innanocomposite materials due to the general tendency of nanoparticles to aggregate under processing condit ...

134. Polymer Viscoelasticity and Residual Stress Effects on Nanoimprint Lithography
Topic: Nanomaterials
Published: 5/24/2007
Authors: Yifu Ding, Hyun Wook Ro, Jack F Douglas, Ronald Leland Jones, Daniel R. Hines, Alamgir Karim, Christopher L Soles
Abstract: We examine the influence of viscoelastic effects on the stability of nanoimprinted polymer films. The decay of features for polymers below the critical entanglement molecular mass at elevated temperatures is determined by simple surface tension and ...

135. Towards Industrial Scale Fabrication of Nanowire-Based Devices
Topic: Nanomaterials
Published: 4/11/2007
Author: Babak Nikoobakht
Abstract: The key requirements for mass fabrication of nanodevices are directed positioning and alignment of nanoparticles (e.g., nanowires) with known registries on a large scale. Here, these issues are addressed in a high throughput and scalable approach fo ...

136. Crystallization of Polyethylene Oxide Patterend by Nanoimprint Lithography
Topic: Nanomaterials
Published: 3/28/2007
Authors: Brian C. Okerberg, Christopher L Soles, Jack F Douglas, Hyun Wook Ro, Alamgir Karim
Abstract: The crystallization behavior of poly(ethylene oxide) (PEO) films patterned by nanoimprint lithography is studied. The imprinted PEO film consists of parallel lines, approximately 240 nm wide and 320 nm tall, on a 400 nm pitch with a residual laye ...

137. Traceable Micro-Force Calibration for Instrumented Indentation Testing
Topic: Nanomaterials
Published: 2/13/2007
Authors: Douglas T Smith, Gordon Allan Shaw, Richard Seugling, Jon Robert Pratt, Dan Xiang
Abstract: We describe the development, performance and application of an accurate SI-traceable force calibration and verification system for potential use in the field calibration of commercial instrumented indentation testing (IIT) instruments. The system co ...

138. Theory of nuclear resonant inelastic scattering from 57Fe in a single-walled carbon nanotube
Topic: Nanomaterials
Published: 1/1/2007
Author: Vinod K Tewary
Abstract: Line shapes of one phonon lines are calculated in the nuclear resonant inelastic X-ray scattering (NRIXS) from 57Fe embedded in a single-walled carbon nanotube using a computationally efficient phonon Green's function method which is also applicable ...

139. Evidence for Internal Stresses Induced by Nanoimprint Lithography
Topic: Nanomaterials
Published: 11/30/2006
Authors: Hyun Wook Ro, Yifu Ding, Hae-Jeong Lee, Daniel R. Hines, Ronald Leland Jones, Eric K Lin, Alamgir Karim, Wen-Li Wu, Christopher L Soles
Abstract: The thermal embossing form of nanoimprint lithography is used to pattern arrays of nanostructures into several different polymer films. The shape of the imprinted patterns is characterized with nm precision using both X-ray scattering and reflectivi ...

140. Efficient Green?s Function Modeling of Line and Surface Defects in Multilayered Anisotropic Elastic and Piezoelectric Material
Topic: Nanomaterials
Published: 10/31/2006
Authors: B. Yang, Vinod K Tewary
Abstract: Green?s function (GF) modeling of defects may take effect only if the GF as well as its various integrals over a line, a surface and/or a small volume can be efficiently evaluated. The GF itself is needed in modeling a point defect while the integral ...

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