NIST logo

Publications Portal

You searched on:
Topic Area: Metrology

Displaying records 31 to 40 of 851 records.
Resort by: Date / Title


31. TESTING LONG-WAVELENGTH ACOUSTIC FLOWMETER CONCEPTS FOR FLUE GAS FLOWS
Topic: Metrology
Published: 6/22/2012
Authors: Lee James Gorny, Keith A Gillis, Michael R Moldover
Abstract: As a part of NIST‰s program to standardize measurements of greenhouse gas emissions, we are developing a long-wavelength acoustic flowmeter (LWAF) for accurate, economical measurements of exhaust flows from coal-burning power plants. Measurements of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911460

32. Airspeed Calibration Services: Laser Doppler Anemometer Calibration and Its Uncertainty
Topic: Metrology
Published: 6/20/2012
Authors: Iosif I Shinder, Michael R Moldover, James M Hall, Mike Duncan, Joe Keck
Abstract: The National Institute of Standards and Technology (NIST) and the Oak Ridge National Laboratory (ORNL) are improving their airspeed calibration services. Both laboratories use spinning disks to generate linear velocities that are traceable to NIST‰s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911456

33. Improved Nozzle Manifold for Gas Flow Calibrations
Topic: Metrology
Published: 6/20/2012
Authors: Aaron N Johnson, Chunhui Li, John D Wright, Gina M Kline, Christopher J. Crowley
Abstract: We developed a new nozzle manifold that reduced the uncertainty of flow calibrations from 0.09 % to as low as 0.074 % for flows of air up to 0.84 kg/s (43 000 L/min at reference conditions of 101.325 kPa and 293.15 K). The nozzle manifold also reduc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911475

34. USARSim/ROS: A Combined Framework for Robotic Control and Simulation
Topic: Metrology
Published: 6/20/2012
Authors: Stephen B. Balakirsky, Zeid Kootbally
Abstract: The Robot Operating System (ROS) has been steadily gaining popularity among robotics researchers as an open source framework for robot control. The Unified System for Automation and Robot Simulation (USARSim) has been used for many years by robotics ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910918

35. Technology Readiness Levels for Randomized Bin Picking
Topic: Metrology
Published: 6/13/2012
Authors: Jeremy A Marvel, Roger D. Eastman, Geraldine S Cheok, Kamel Shawki Saidi, Tsai Hong Hong, Elena R Messina
Abstract: A proposal for the utilization of Technology Readiness Levels to the application of unstructured bin picking is discussed. A special session was held during the 2012 Performance Metrics for Intelligent Systems workshop to discuss the challenges and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911421

36. Calibration of Laminar Flow Meters for Process Gases
Topic: Metrology
Published: 6/1/2012
Authors: John D Wright, Thiago Cobu, Robert F Berg, Michael R Moldover
Abstract: We calibrated three models of commercially-manufactured, laminar flow meters (LFMs) at four pressures (100 kPa, 200 kPa, 300 kPa, and 400 kPa) with five gases (N2, Ar, He, CO2, and SF6) over a 10:1 flow range using NIST‰s primary flow standards as re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908560

37. Modeling the Peak Cutting Temperature During High-Speed Machining of AISI 1045 Steel
Topic: Metrology
Published: 5/22/2012
Authors: Timothy J Burns, Steven P Mates, Richard L. Rhorer, Eric Paul Whitenton, Debasis Basak
Abstract: This paper presents new experimental data on AISI 1045 steel from the NIST pulse-heated Kolsky Bar Laboratory. The material is shown to exhibit a stiffer response to compressive loading when it has been rapidly preheated, than it does when it has bee ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908848

38. On CD-AFM bias related to probe bending
Topic: Metrology
Published: 4/9/2012
Authors: Vladimir A Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910903

39. Ground Truth for Evaluating 6 Degrees of Freedom Pose Estimation Systems
Topic: Metrology
Published: 3/28/2012
Authors: Jeremy A Marvel, Joseph A Falco, Tsai Hong Hong
Abstract: Systems developed to estimate poses of objects in 6 degrees of freedom (6DOF) Cartesian space (X, Y, and Z coordinates plus roll, pitch, and yaw) are reliant on the vendors' own processes to determine performance and measurement accuracy. These pract ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910646

40. Measurement of H2O-Broadening of O2 A-band Transitions and Implications for Atmospheric Remote Sensing
Topic: Metrology
Published: 3/27/2012
Authors: E. M. Vess, C. J. Wallace, H. M. Campbell, V. E. Awadalla, Joseph Terence Hodges, David A Long, D. K. Havey
Abstract: We present laboratory measurements of H2O-broadened 16O2 A-band ( ) absorption spectra acquired with a laser-based photoacoustic spectroscopy method. This absorption band is widely used in a variety of high-precision atmospheric remote sensing appli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910528



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series