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Topic Area: Metrology

Displaying records 31 to 40 of 846 records.
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31. Calibration of Laminar Flow Meters for Process Gases
Topic: Metrology
Published: 6/1/2012
Authors: John D Wright, Thiago Cobu, Robert F Berg, Michael R Moldover
Abstract: We calibrated three models of commercially-manufactured, laminar flow meters (LFMs) at four pressures (100 kPa, 200 kPa, 300 kPa, and 400 kPa) with five gases (N2, Ar, He, CO2, and SF6) over a 10:1 flow range using NIST‰s primary flow standards as re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908560

32. Modeling the Peak Cutting Temperature During High-Speed Machining of AISI 1045 Steel
Topic: Metrology
Published: 5/22/2012
Authors: Timothy J Burns, Steven P Mates, Richard L. Rhorer, Eric Paul Whitenton, Debasis Basak
Abstract: This paper presents new experimental data on AISI 1045 steel from the NIST pulse-heated Kolsky Bar Laboratory. The material is shown to exhibit a stiffer response to compressive loading when it has been rapidly preheated, than it does when it has bee ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908848

33. On CD-AFM bias related to probe bending
Topic: Metrology
Published: 4/9/2012
Authors: Vladimir A Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910903

34. Ground Truth for Evaluating 6 Degrees of Freedom Pose Estimation Systems
Topic: Metrology
Published: 3/28/2012
Authors: Jeremy A Marvel, Joseph A Falco, Tsai Hong Hong
Abstract: Systems developed to estimate poses of objects in 6 degrees of freedom (6DOF) Cartesian space (X, Y, and Z coordinates plus roll, pitch, and yaw) are reliant on the vendors' own processes to determine performance and measurement accuracy. These pract ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910646

35. Measurement of H2O-Broadening of O2 A-band Transitions and Implications for Atmospheric Remote Sensing
Topic: Metrology
Published: 3/27/2012
Authors: E. M. Vess, C. J. Wallace, H. M. Campbell, V. E. Awadalla, Joseph Terence Hodges, David A Long, D. K. Havey
Abstract: We present laboratory measurements of H2O-broadened 16O2 A-band ( ) absorption spectra acquired with a laser-based photoacoustic spectroscopy method. This absorption band is widely used in a variety of high-precision atmospheric remote sensing appli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910528

36. 2011 Solutions in Perception Challenge Performance Metrics and Results
Topic: Metrology
Published: 3/22/2012
Authors: Jeremy A Marvel, Tsai Hong Hong, Elena R Messina
Abstract: The 2011 Solutions in Perception Challenge (SPC) presented an international collection of teams with the opportunity to develop algorithms that could positively identify and accurately locate in space an arbitrary collection of artifacts. Researchers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910645

37. An Overview of Robot-Sensor Calibration Methods for Evaluation of Perception Systems
Topic: Metrology
Published: 3/22/2012
Authors: Mili Indra Shah, Roger D. Eastman, Tsai Hong Hong
Abstract: In this paper, an overview of methods that solve the robot-sensor calibration problem of the forms AX = XB and AX = YB is given. Each form will be split into three solutions: separable closed-form solutions, simultaneous closed- form solutions, and i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910651

38. Traceable Calibration of a Critical Dimension Atomic Force Microscope
Topic: Metrology
Published: 3/9/2012
Authors: Ronald G Dixson, Ndubuisi George Orji, Craig Dyer McGray, John E Bonevich, Jon C Geist
Abstract: The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this program, and the focus of this paper, is the use of critical dimension atomic force ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908943

39. Measurement and Evaluation of Visibility Experiments for Powered Industrial Vehicles
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7837
Topic: Metrology
Published: 12/16/2011
Authors: Roger V Bostelman, Li Peng Liang
Abstract: Powered Industrial Vehicles, such as forklifts, are widely used in manufacturing and other industries. The National Institute of Standards and Technology's Intelligent System Division has been researching advanced 2D and 3D imaging sensors and their ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909306

40. Ultra-Precision Linear Motion Metrology of a Commerically Available Linear Translation Stage
Topic: Metrology
Published: 11/18/2011
Authors: Ronnie R Fesperman, M Alkan Donmez, Shawn P Moylan
Abstract: Many new compact ultra-precision linear translation stages with exceptionally long ranges of motion on the order of tens of millimeters and positioning resolutions on the order of a nanometer are finding their way into emerging nanotechnologies. Thi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909376



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