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Topic Area: Nanotechnology
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Displaying records 271 to 280 of 387 records.
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271. Miniature Piezoceramic Actuators with Improved Fatigue Resistance
Topic: Nanotechnology
Published: 6/1/2005
Authors: Stephanie A Hooker, Jens Mueller, Clayton Kostelecky, K. Womer
Abstract: Piezoelectric ceramics are desirable actuator materials for many biomedical applications due to their ability to generate precise, controlled motion with applied voltage. Herein, we report the fabrication of miniature piezoelectric ceramic actuators ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30065

272. Acoustical methods to determine thin-film and nanoscale mechanical properties
Topic: Nanotechnology
Published: 5/31/2005
Authors: Donna C. Hurley, Roy Howard Geiss, N Jennett, Malgorzata Kopycinska-Mueller, A Maxwell, Jens Mueller, David Thomas Read, J Wright
Abstract: We describe two acoustical methods to evaluate the mechanical properties of thin films and nanoscale structures: atomic force acoustic microscopy and surface acoustic wave spectroscopy. The elastic properties of an 800-nm-thick nickel film were exami ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50075

273. In Situ Ellipsometric Study of PEG/Cl^u-^ Coadsorption on Cu, Ag, and Au
Topic: Nanotechnology
Published: 5/1/2005
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: Spectroscopic ellipsometry was used to examine the adsorption of polyethylene glycol (PEG) and Cl- on polycrystalline Cu, Ag and Au electrodes in sulfuric acid. In halide-free sulfuric acid, PEG adsorption on Cu and Ag is minimal at potentials positi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831365

274. Nanometrology - FY 2004 Programs and Selected Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7130
Topic: Nanotechnology
Published: 4/15/2005
Author: C M Allocca
Abstract: The MSEL Nanometrology Program incorporates basic measurement metrologies to determine material properties, process monitoring at the nanoscale, nano-manufacturing and fabrication techniques, and structural characterization and analysis techniques, s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850124

275. Elastic-property measurements of ultrathin films using atomic force acoustic microscopy
Topic: Nanotechnology
Published: 4/5/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Jens Mueller, Donna C. Hurley
Abstract: Atomic force acoustic microscopy (AFAM), an emerging technique that affords nanoscale lateral and depth resolution, was employed to measure the elastic properties of ultrathin films. In this study we measured the indentation modulus M of three nickel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50093

276. Chemical Imaging of Heterogeneous Polymeric Materials With Near-Field IR Microscopy
Topic: Nanotechnology
Published: 4/1/2005
Authors: Chris A Michaels, D B Chase, Stephan J Stranick
Abstract: The development of techniques to probe spatial variations in chemical composition on the nanoscale continues to be an important area of research in the characterization of polymeric materials. Recent efforts have focused on the development and chara ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831470

277. Influence of Tip Wear on Atomic Force Acoustic Microscopy Experiments
Topic: Nanotechnology
Published: 1/31/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Paul Rice, Donna C. Hurley
Abstract: Tip wear and its corresponding change in geometry is a major impediment for quantifying atomic force acoustic microscopy (AFAM). To better understand the process of tip wear and its influence on AFAM measurements of material elastic properties, we ha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30031

278. Development and Application of Multiple Delta-Layer Reference Materials for Semiconductor Analysis
Topic: Nanotechnology
Published: 1/1/2005
Authors: K J Kim, D Moon, P Chi, David S Simons
Abstract: The rapid progress in the semiconductor industry requires more precise in-depth profiling analysis of doping elements in narrower and shallower regions. Secondary ion mass spectrometry (SIMS) is the most popular technique for the depth distribution o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831369

279. Polycyclic Aromatic Hydrocarbons in Flames, in Diesel Fuels, and in Diesel Emissions
Topic: Nanotechnology
Published: 1/1/2005
Authors: Robert A Fletcher, R Dobbins, Bruce A Benner Jr, S Hoeft
Abstract: Diesel fuels and emissions are composed of numerous hydrocarbon species. Combustion generated or pyrogenic polycyclic aromatic hydrocarbons (PAHs) derived from premixed and diffusion flames often consists of the most stable benzenoid PAHs. In contra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831342

280. Nanoscale Elastic-Property Mapping with Contact-Resonance-Frequency AFM
Topic: Nanotechnology
Published: 12/31/2004
Authors: Donna C. Hurley, Tony B. Kos, Paul Rice
Abstract: We describe dynamic atomic force microscopy (AFM) techniques to map the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) methods that have previously been used ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30030



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