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Topic Area: Nanotechnology
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Displaying records 261 to 270 of 387 records.
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261. Consistency of Delta ^u13^ C Measurements Improved
Topic: Nanotechnology
Published: 2/1/2006
Authors: T B Copelen, W Brand, M Gehre, M Groening, HAJ Meijer, Blaza Toman, R Michael Verkouteren
Abstract: We present state-of-the-art measurements and data evaluation methods to show that the consistency of carbon isotope ratio measurements can be improved 39 % to 47 % by anchoring the measurement scale with two isotopic reference materials differing in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831406

262. An In Situ Ellipsometric Study of Cl^u-^ -Induced Adsorption of PEG on Ru and on Underpotential Deposited Cu on Ru
Topic: Nanotechnology
Published: 1/1/2006
Authors: Marlon L Walker, Lee J Richter, Daniel Josell, Thomas P Moffat
Abstract: The adsorption of PEG-Cl on a.) air-oxidized Ru, b.) reduced or activated Ru and c.) underpotential deposited (upd) Cu on activated Ru was examined in-situ using spectroscopic ellipsometry. In the absence of Cl- ion, PEG adsorption was minimal at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831389

263. Polycyclic Aromatic Hydrocarbons in Flames, in Diesel Fuels, and in Diesel Emissions
Topic: Nanotechnology
Published: 12/1/2005
Authors: R Dobbins, Robert A Fletcher, Bruce A Benner Jr, S Hoeft
Abstract: Numerous chemical analyses of gaseous and particulate samples from laboratory flames provide a library of data on the polycyclic aromatic hydrocarbons (PAH) species found in diverse flame types burning fuels consisting of pure gaseous hydrocarb ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831287

264. A New Monte Carlo Application for Complex Sample Geometries
Topic: Nanotechnology
Published: 11/1/2005
Author: Nicholas W m Ritchie
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831377

265. Direct Preparation of Particles From Liquid Suspension for ESEM or SEM Analysis
Topic: Nanotechnology
Published: 10/1/2005
Authors: Scott A Wight, Richard D Holbrook
Abstract: A simplified method for the preparation of particles from liquid suspensions has been developed. Particles are deposited directly on carbon planchets for rapid analysis by environmental scanning electron microscopy or by conventional scanning electr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831362

266. Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods
Topic: Nanotechnology
Published: 9/23/2005
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos, Roy Howard Geiss
Abstract: We describe a dynamic atomic force microscopy (AFM) method to measure the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) techniques and involves the resonant ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50024

267. IMS-Based Trace Explosives Detectors for First Responder Use
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7240
Topic: Nanotechnology
Published: 9/1/2005
Authors: Jennifer R Verkouteren, John G Gillen, R Michael Verkouteren, Robert A Fletcher, E S. Etz, George A Klouda, Alim A Fatah, P Mattson
Abstract: The purpose of this document is to establish minimum performance requirements and an associated test method for Ion Mobility Spectrometry (IMS) based trace explosives detectors for use by the first responder community. Information concerning the the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831386

268. Contact mechanics and tip shape in afm-based nanomechanical measurements
Topic: Nanotechnology
Published: 8/31/2005
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: Stiffness-load curves obtained in quantitative atomic force acoustic microscopy (AFAM) measurements depend on both the elastic properties of the sample and the geometry of the atomic force microscope (AFM) tip. The geometry of silicon AFM tips change ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50203

269. Quantitative Elastic-Property Measurements at the Nanoscale with Atomic Force Acoustic Microscopy
Topic: Nanotechnology
Published: 8/31/2005
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos, Roy Howard Geiss
Abstract: We are developing metrology for rapid, quantitative assessment of elastic porperties with nanoscale spatial resolution. Atomic force acoustic microscopy (AFAM) methods enable modulus measurements at either a single point or as a map of local property ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50097

270. Depth Profiling of Poly(L-Lactic Acid)/Pluronic Polymer BlendsWith Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Topic: Nanotechnology
Published: 6/1/2005
Authors: Christine M. Mahoney, J Yu, J Gardella
Abstract: Polymeric blends comprised of the biodegradable polymer poly-L-lactic acid (PLLA) and polyethylene oxide (PEO) are of considerable interest due to their potential applications as protein drug delivery devices. In such devices, the PEO component will ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831372



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