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Topic Area: Nanotechnology
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Displaying records 261 to 270 of 391 records.
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261. Characterization of Gunpowder Samples Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Topic: Nanotechnology
Published: 4/1/2006
Authors: Christine M. Mahoney, John G Gillen, Albert J. Fahey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901923

262. New Guidelines for delta-13-C Measurements
Topic: Nanotechnology
Published: 4/1/2006
Authors: T.B. Coplen, W.A. Brand, M. Gehre, M. Groning, H.A.J. Meijer, Blaza Toman, R Michael Verkouteren
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901932

263. Influence of surface energy and relative humidity on AFM nanomechanical contact stiffness
Topic: Nanotechnology
Published: 3/9/2006
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, D Julthongpiput, Michael J Fasolka
Abstract: The effects of surface functionality and relative humidity (RH) on nanomechanical properties were investigated using atomic force acoustic microscopy (AFAM), a contact scanned probe microscopy (SPM) technique. Self-assembled monolayers (SAMs) with co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50243

264. Summary of ISO/TC 201 Standard: XIII. ISO 18114:2003 - Surface Chemical Analysis - Secondary Ion Mass Spectrometry - Determination of Relative Sensitivity Factors From Ion-Implanted Reference Materials
Topic: Nanotechnology
Published: 3/1/2006
Author: David S Simons
Abstract: Ion-implanted materials are commonly used in secondary-ion mass spectrometry for the calibration of instruments. This international Standard was prepared to provide a uniform method for determining the relative sensitivity factor (RSF) of an element ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831402

265. Consistency of Delta ^u13^ C Measurements Improved
Topic: Nanotechnology
Published: 2/1/2006
Authors: T B Copelen, W Brand, M Gehre, M Groening, HAJ Meijer, Blaza Toman, R Michael Verkouteren
Abstract: We present state-of-the-art measurements and data evaluation methods to show that the consistency of carbon isotope ratio measurements can be improved 39 % to 47 % by anchoring the measurement scale with two isotopic reference materials differing in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831406

266. An In Situ Ellipsometric Study of Cl^u-^ -Induced Adsorption of PEG on Ru and on Underpotential Deposited Cu on Ru
Topic: Nanotechnology
Published: 1/1/2006
Authors: Marlon L Walker, Lee J Richter, Daniel Josell, Thomas P Moffat
Abstract: The adsorption of PEG-Cl on a.) air-oxidized Ru, b.) reduced or activated Ru and c.) underpotential deposited (upd) Cu on activated Ru was examined in-situ using spectroscopic ellipsometry. In the absence of Cl- ion, PEG adsorption was minimal at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831389

267. Polycyclic Aromatic Hydrocarbons in Flames, in Diesel Fuels, and in Diesel Emissions
Topic: Nanotechnology
Published: 12/1/2005
Authors: R Dobbins, Robert A Fletcher, Bruce A Benner Jr, S Hoeft
Abstract: Numerous chemical analyses of gaseous and particulate samples from laboratory flames provide a library of data on the polycyclic aromatic hydrocarbons (PAH) species found in diverse flame types burning fuels consisting of pure gaseous hydrocarb ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831287

268. A New Monte Carlo Application for Complex Sample Geometries
Topic: Nanotechnology
Published: 11/1/2005
Author: Nicholas W m Ritchie
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831377

269. Direct Preparation of Particles From Liquid Suspension for ESEM or SEM Analysis
Topic: Nanotechnology
Published: 10/1/2005
Authors: Scott A Wight, Richard D Holbrook
Abstract: A simplified method for the preparation of particles from liquid suspensions has been developed. Particles are deposited directly on carbon planchets for rapid analysis by environmental scanning electron microscopy or by conventional scanning electr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831362

270. Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods
Topic: Nanotechnology
Published: 9/23/2005
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos, Roy Howard Geiss
Abstract: We describe a dynamic atomic force microscopy (AFM) method to measure the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) techniques and involves the resonant ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50024



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