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Topic Area: Nanotechnology
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Displaying records 261 to 270 of 395 records.
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261. Quantum Dot Dissemination and Behavior in Bacterial Biofilms
Topic: Nanotechnology
Published: 5/7/2006
Authors: Jayne B Morrow, Richard D Holbrook, Cynthia J Zeissler
Abstract: Quantum dots (QDs) are colloidal semiconductor nanocrystals that photoluminescence emission is proportional to the dot size and have been utilized in fluorescent imaging in biological systems. Biofilms are communities of microorganisms attached to su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902126

262. Variable Magnification With Kirkpatrick-Baez Optics for Synchrotron X-Ray Microscopy
Series: Journal of Research (NIST JRES)
Topic: Nanotechnology
Published: 5/1/2006
Authors: Terrence J Jach, A S Bakulin, S M Durbin, J Pedulla, A T Macrander
Abstract: We describe the distinction between the operation of a short focal lengthx-ray microscope forming a real image with a laboratory source (convergentillumination) and with a highly collimated intense beam from a synchrotronlight source (K\{o}hler illum ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831409

263. Size-related plasticity effects in AFM silicon cantilever tips
Topic: Nanotechnology
Published: 4/17/2006
Authors: Malgorzata Kopycinska-Mueller, Roy Howard Geiss, Donna C. Hurley
Abstract: We are developing dynamic atomic force microscopy (AFM) techniques to determine nanoscale elastic properties. Atomic force acoustic microscopy (AFAM) makes use of the resonant frequencies of an AFM cantilever while its tip contacts the sample surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50330

264. Elastodynamic characterization of imprinted nanolines
Topic: Nanotechnology
Published: 4/3/2006
Authors: Ward L Johnson, Colm Flannery, Sudook A Kim, Roy Howard Geiss, Christopher L Soles, Paul R Heyliger
Abstract: Experimental techniques employing Brillouin light scattering (BLS) and analytical techniques employing finite-element (FE) and Farnell-Adler models are being developed for characterizing acoustic modes and determining elastic moduli and dimensions o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50332

265. Characterization of Gunpowder Samples Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Topic: Nanotechnology
Published: 4/1/2006
Authors: Christine M. Mahoney, John G Gillen, Albert J. Fahey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901923

266. New Guidelines for delta-13-C Measurements
Topic: Nanotechnology
Published: 4/1/2006
Authors: T.B. Coplen, W.A. Brand, M. Gehre, M. Groning, H.A.J. Meijer, Blaza Toman, R Michael Verkouteren
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901932

267. Influence of surface energy and relative humidity on AFM nanomechanical contact stiffness
Topic: Nanotechnology
Published: 3/9/2006
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, D Julthongpiput, Michael J Fasolka
Abstract: The effects of surface functionality and relative humidity (RH) on nanomechanical properties were investigated using atomic force acoustic microscopy (AFAM), a contact scanned probe microscopy (SPM) technique. Self-assembled monolayers (SAMs) with co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50243

268. Summary of ISO/TC 201 Standard: XIII. ISO 18114:2003 - Surface Chemical Analysis - Secondary Ion Mass Spectrometry - Determination of Relative Sensitivity Factors From Ion-Implanted Reference Materials
Topic: Nanotechnology
Published: 3/1/2006
Author: David S Simons
Abstract: Ion-implanted materials are commonly used in secondary-ion mass spectrometry for the calibration of instruments. This international Standard was prepared to provide a uniform method for determining the relative sensitivity factor (RSF) of an element ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831402

269. Consistency of Delta ^u13^ C Measurements Improved
Topic: Nanotechnology
Published: 2/1/2006
Authors: T B Copelen, W Brand, M Gehre, M Groening, HAJ Meijer, Blaza Toman, R Michael Verkouteren
Abstract: We present state-of-the-art measurements and data evaluation methods to show that the consistency of carbon isotope ratio measurements can be improved 39 % to 47 % by anchoring the measurement scale with two isotopic reference materials differing in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831406

270. An In Situ Ellipsometric Study of Cl^u-^ -Induced Adsorption of PEG on Ru and on Underpotential Deposited Cu on Ru
Topic: Nanotechnology
Published: 1/1/2006
Authors: Marlon L Walker, Lee J Richter, Daniel Josell, Thomas P Moffat
Abstract: The adsorption of PEG-Cl on a.) air-oxidized Ru, b.) reduced or activated Ru and c.) underpotential deposited (upd) Cu on activated Ru was examined in-situ using spectroscopic ellipsometry. In the absence of Cl- ion, PEG adsorption was minimal at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831389



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