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Topic Area: Nanotechnology

Displaying records 351 to 360 of 389 records.
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351. Comparison of Semiconductor Pixel Array, Phosphor Plate, and Track-Etch Detectors for Alpha Autoradiography
Topic: Nanotechnology
Published: 12/1/1997
Author: Cynthia J Zeissler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100387

352. Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-Assembled Monolayers and Secondary Ion Mass Spectroscopy
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100382

353. Dynamics and Free Energy of Polymers Partitioning into a Nanoscale Pore
Topic: Nanotechnology
Published: 12/1/1997
Authors: S. M. Bezrukov, I Vodyanoy, R A Brutyan, J. J. Kasianowicz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100220

354. Effect of Ge on the Segregation of B in Si(100) and Si(110)
Topic: Nanotechnology
Published: 12/1/1997
Authors: P E Thompson, C Silvestre, G Jernigan, K D Hobart, David S Simons, M Gregg
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100375

355. Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100381

356. Indium Diffusion in n-type Gallium Arsenide
Topic: Nanotechnology
Published: 12/1/1997
Authors: W M Li, R M Cohen, David S Simons, P Chi
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100358

357. Measurement of ESEM Electron Beam Profiles with Self-Assembled Monolayers and SIMS
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100336

358. Microhotplate Chemical Vapor Deposition in the Environmental SEM Chamber
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, Richard E Cavicchi, M J Nystrom, F DiMeo
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100380

359. SIMS Imaging of Electron Beam Scattering in the Environmental SEM
Topic: Nanotechnology
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100383

360. The Scanning Scattering Microscopy for Surface and Buried Interface Roughness and Defect Imaging
Topic: Nanotechnology
Published: 12/1/1997
Authors: J Lorincik, J Fine, John G Gillen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100359



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