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Topic Area: Nanotechnology

Displaying records 231 to 240 of 387 records.
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231. NIST Program to Support Testing and Evaluation of Trace Explosive Detection
Topic: Nanotechnology
Published: 10/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, Wayne Smith
Abstract: Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831432

232. Spring constant calibration of AFM cantilevers with a piezoresistive cantilever transfer standard
Topic: Nanotechnology
Published: 9/24/2007
Authors: Eric Langlois, G. A. Shaw, J. A. Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers used in atomic force microscopy (AFM) by means of a piezoresistive cantilever. Before use, the piezoresistive cantilever was calibrated with an absolute force standard, the NIST el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50568

233. NIST Program to Support Testing and Evaluation of Trace Explosives Detection
Topic: Nanotechnology
Published: 9/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, W.J. Smith
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901934

234. Nanoscale measurements of Poisson's ratio with contact-resonance atomic force microscopy
Topic: Nanotechnology
Published: 8/9/2007
Authors: Donna C. Hurley, J Turner
Abstract: We describe contact-resonance atomic force microscopy (AFM) methods to quantitatively measure Poisson's ratio v or shear modulus G at the same time as Young's modulus E. In contact-resonance AFM, the frequencies of the cantilever's resonant vibration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50507

235. Automated Patterning of Nanoscale Metal-Molecule-Metal Junctions on Self-Assembled Monolayers
Topic: Nanotechnology
Published: 7/1/2007
Authors: J C. Garno, Christopher D Zangmeister, J Batteas
Abstract: Automated scanned probe lithography has been employed to form nanoscale Cu structures through electroless metal deposition onto patterned carboxylic acid terminated self-assembled monolayers. Using this approach, Cu structures of ~ 40 nm 200 nm in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831367

236. RAPID INSPECTION OF CARBON NANOTUBE QUALITY
Topic: Nanotechnology
Published: 7/1/2007
Authors: Stephanie A Hooker, Roy Howard Geiss, Aparna Kar
Abstract: Carbon nanotubes have unique properties of interest for applications in aerospace, electronics, and biotechnology. However, the properties of different batches of carbon nanotubes can vary considerably depending on chemical purity and the nanotube ty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50489

237. Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt Co Alloy multilayer by SIMS using a Buckminsterfullerene (C60) Source
Topic: Nanotechnology
Published: 5/15/2007
Authors: Kyung Joong Kim, David S Simons, John G Gillen
Abstract: Buckmins erfullerene ion beam has been applied o he dep h profiling of an al erna ing pure P and pure Co mul ilayer. Quan i a ive dep h profiling was performed by secondary ion mass spec rome ry (SIMS) wi h C60 ions using P Co alloy films wi h di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902088

238. Nanostructured, multifunctional tribological coatings
Topic: Nanotechnology
Published: 5/1/2007
Authors: In-Wook Park, Jianliang Lin, William C. Moerbe, Brajendra Mishra, John J. Moore, Jennifer Anton, William D. Sproul, Kwang Ho Kim, Audrey A. Vooevodin, Evgeny A. Levashov
Abstract: A number of multicomponents, nanostructured coatings have been produced for a range of tribological applications. This paper will discuss four such nanocomposite coating systems: (i) Ti-Si-B-C-N; (ii) Cr-B-N; (iii) TiC-C and (iv) Cr-Al-N produced by ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50546

239. Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, James Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831399

240. Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831413



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