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Topic Area: Nanotechnology

Displaying records 231 to 240 of 390 records.
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231. 3-Dimensional Compositional Analysis in Drug Eluting Stent (DES) Coatings Using Cluster Secondary Ion Mass Spectrometry (Cluster SIMS)
Topic: Nanotechnology
Published: 2/1/2008
Authors: Christine M. Mahoney, A M Belu, Albert J. Fahey
Abstract: Cluster Secondary Ion Mass Spectrometry (cluster SIMS) employing an SF5+ polyatomic primary ion sputter source in conjunction with a Bi3+ analysis source was used to obtain 3-dimensional molecular information in polymeric-based drug eluting stent (DE ...

232. High-performance carbon nanotube coatings for high-power laser radiometry
Topic: Nanotechnology
Published: 1/3/2008
Authors: Krishna Ramadurai, Christopher L Cromer, Laurence A. Lewis, Katie Hurst, Anne Dillon, Roop Mahajan, John H Lehman
Abstract: Radiometry for the next generation of high-efficiency, high-power industrial lasers requires thermal management at optical power levels exceeding 10 kW. Laser damage and thermal transport present fundamental challenges for laser radiometry in suppo ...

233. Multi-Probe Assembly
Topic: Nanotechnology
Published: 12/31/2007
Authors: John Wason, William Gressick, J Wen, Jason John Gorman, Nicholas G Dagalakis
Abstract: This paper describes the algorithm development and experimental results of a multi-probe micro-assembly system. The experimental testbed consists of two actuated probes, an actuated die stage, and vision feedback. The kinematics relationships for th ...

234. NIST Program to Support Testing and Evaluation of Trace Explosive Detection
Topic: Nanotechnology
Published: 10/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, Wayne Smith
Abstract: Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and c ...

235. Spring constant calibration of AFM cantilevers with a piezoresistive cantilever transfer standard
Topic: Nanotechnology
Published: 9/24/2007
Authors: Eric Langlois, G. A. Shaw, J. A. Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers used in atomic force microscopy (AFM) by means of a piezoresistive cantilever. Before use, the piezoresistive cantilever was calibrated with an absolute force standard, the NIST el ...

236. NIST Program to Support Testing and Evaluation of Trace Explosives Detection
Topic: Nanotechnology
Published: 9/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, W.J. Smith

237. Nanoscale measurements of Poisson's ratio with contact-resonance atomic force microscopy
Topic: Nanotechnology
Published: 8/9/2007
Authors: Donna C. Hurley, J Turner
Abstract: We describe contact-resonance atomic force microscopy (AFM) methods to quantitatively measure Poisson's ratio v or shear modulus G at the same time as Young's modulus E. In contact-resonance AFM, the frequencies of the cantilever's resonant vibration ...

238. Automated Patterning of Nanoscale Metal-Molecule-Metal Junctions on Self-Assembled Monolayers
Topic: Nanotechnology
Published: 7/1/2007
Authors: J C. Garno, Christopher D Zangmeister, J Batteas
Abstract: Automated scanned probe lithography has been employed to form nanoscale Cu structures through electroless metal deposition onto patterned carboxylic acid terminated self-assembled monolayers. Using this approach, Cu structures of ~ 40 nm 200 nm in ...

Topic: Nanotechnology
Published: 7/1/2007
Authors: Stephanie A Hooker, Roy Howard Geiss, Aparna Kar
Abstract: Carbon nanotubes have unique properties of interest for applications in aerospace, electronics, and biotechnology. However, the properties of different batches of carbon nanotubes can vary considerably depending on chemical purity and the nanotube ty ...

240. Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt Co Alloy multilayer by SIMS using a Buckminsterfullerene (C60) Source
Topic: Nanotechnology
Published: 5/15/2007
Authors: Kyung Joong Kim, David S Simons, John G Gillen
Abstract: Buckmins erfullerene ion beam has been applied o he dep h profiling of an al erna ing pure P and pure Co mul ilayer. Quan i a ive dep h profiling was performed by secondary ion mass spec rome ry (SIMS) wi h C60 ions using P Co alloy films wi h di ...

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