NIST logo

Publications Portal

You searched on:
Topic Area: Nanotechnology

Displaying records 231 to 240 of 383 records.
Resort by: Date / Title


231. Automated Patterning of Nanoscale Metal-Molecule-Metal Junctions on Self-Assembled Monolayers
Topic: Nanotechnology
Published: 7/1/2007
Authors: J C. Garno, Christopher D Zangmeister, J Batteas
Abstract: Automated scanned probe lithography has been employed to form nanoscale Cu structures through electroless metal deposition onto patterned carboxylic acid terminated self-assembled monolayers. Using this approach, Cu structures of ~ 40 nm 200 nm in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831367

232. RAPID INSPECTION OF CARBON NANOTUBE QUALITY
Topic: Nanotechnology
Published: 7/1/2007
Authors: Stephanie A Hooker, Roy Howard Geiss, Aparna Kar
Abstract: Carbon nanotubes have unique properties of interest for applications in aerospace, electronics, and biotechnology. However, the properties of different batches of carbon nanotubes can vary considerably depending on chemical purity and the nanotube ty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50489

233. Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt Co Alloy multilayer by SIMS using a Buckminsterfullerene (C60) Source
Topic: Nanotechnology
Published: 5/15/2007
Authors: Kyung Joong Kim, David S Simons, John G Gillen
Abstract: Buckmins erfullerene ion beam has been applied o he dep h profiling of an al erna ing pure P and pure Co mul ilayer. Quan i a ive dep h profiling was performed by secondary ion mass spec rome ry (SIMS) wi h C60 ions using P Co alloy films wi h di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902088

234. Nanostructured, multifunctional tribological coatings
Topic: Nanotechnology
Published: 5/1/2007
Authors: In-Wook Park, Jianliang Lin, William C. Moerbe, Brajendra Mishra, John J. Moore, Jennifer Anton, William D. Sproul, Kwang Ho Kim, Audrey A. Vooevodin, Evgeny A. Levashov
Abstract: A number of multicomponents, nanostructured coatings have been produced for a range of tribological applications. This paper will discuss four such nanocomposite coating systems: (i) Ti-Si-B-C-N; (ii) Cr-B-N; (iii) TiC-C and (iv) Cr-Al-N produced by ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50546

235. Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen, Chang Xu, James Batteas
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831399

236. Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
Topic: Nanotechnology
Published: 2/1/2007
Authors: Christine M. Mahoney, Albert J. Fahey, John G Gillen
Abstract: Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831413

237. Mapping Mechanical Properties on the Nanoscale with Atomic Force Acoustic Microscopy
Topic: Nanotechnology
Published: 1/31/2007
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Tony B. Kos
Abstract: We are developing tools that use the atomic force microscope (AFM) to measure mechanical properties with nanoscale spatial resolution. Contact-resonance-spectroscopy techniques such as atomic force acoustic microscopy (AFAM) involve the vibrational m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50435

238. Widefield Light Microscopy Method for High Resolution and Quantum Dot Spectral Studies
Topic: Nanotechnology
Published: 1/1/2007
Authors: Cynthia J Zeissler, Keana C K Scott, Richard D Holbrook, Peter E. Dr. Barker, Yan Xiao
Abstract: We are exploring methods to achieve 3D 200 nm resolution multispectral imaging with an ordinary inexpensive widefield microscope using incoherent white light sources and an electronically tunable filter. In this work, the capabilities were applied to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902125

239. Characterization and Ion-Induced Degradation of Cross-Linked Poly(Methyl Methacylate) Studies Using Time of Flight Secondary Ion Mass Spectrometry
Topic: Nanotechnology
Published: 12/30/2006
Authors: M S. Wagner, K Lenghaus, John G Gillen, Michael J Tarlov
Abstract: In this study, a series of random copolymers of methyl methacrylate (MMA) and ethylene glycol dimethacrylate (EGDMA) were prepared as surface-initiated polymer (SIP) films on silicon substrates using atom transfer radical polymerization. Positive and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831017

240. Elastic mapping and quantitative nanoscale modulus measurements of SnO2 nanobelts
Topic: Nanotechnology
Published: 12/21/2006
Authors: Yuegui Zheng, Robert E. Geer, Malgorzata Kopycinska-Mueller, Donna C. Hurley
Abstract: A comparative study of the elastic uniformity and modulus of single-crystal SnO2 nanobelts is presented employing two nondestructive techniques based on atomic force microscopy: differential ultrasonic force microscopy (d-UFM) and atomic force acoust ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50382



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series