NIST logo

Publications Portal

You searched on: Topic Area: Math Sorted by: title

Displaying records 21 to 30 of 99 records.
Resort by: Date / Title

21. Artificial Intelligence Tools for Failure Event Data Management and Probability Risk Analysis for Failure Prevention
Topic: Math
Published: 10/25/2009
Authors: Jeffrey T Fong, Pedro Vincente Marcal
Abstract: Over the last thirty years, much research has been done on the development of failure event databases and fatigue modeling of crack growth in pressure vessels and piping. According to a USNRC report (NUREG/CR6674, 2000), results of a fatigue crack g ...

22. Basic Linear Algebra Operations in SLI Arithmetic
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5811
Topic: Math
Published: 3/1/1996
Authors: M M Anuta, Daniel W Lozier, N Schabanel, P R Turner

23. Bayesian Alternative to the Guide's Use of the Welch-Satterthwaite Formula
Topic: Math
Published: 1/3/2006
Author: Raghu N Kacker
Abstract: The Guide to the Expression of Uncertainty in Measurement suggests that to account for the statistical uncertainty in a combined standard uncertainty that arises when one or more of its components are evaluated from a limited number of independent no ...

24. Bayesian uncertainty analysis for a regression model versus application of GUM Supplement 1 to the least-squares estimate
Topic: Math
Published: 5/5/2011
Authors: Blaza Toman, Clemens Elster
Abstract: Application of least-squares as, for instance, in curve fitting is an important tool of data analysis in metrology. It is tempting to employ the supplement 1 to the GUM (GUM-S1) to evaluate the uncertainty associated with the resulting parameter esti ...

25. Bicubic B-Spline Surface Approximation of Invariant Tori
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7731
Topic: Math
Published: 10/20/2010
Authors: Sita Ramamurti, David E. Gilsinn
Abstract: The invariant torus of a coupled system of Van der Pol oscillators is approximated using bicubic B-splines. The paper considers the case of strong nonlinear coupling. In particular, the shapes of invariant torii for the Van der Pol coupling parameter ...

26. Biological Cell Feature Identification by a Modified Watershed-Merging Algorithm
Series: NIST Interagency/Internal Report (NISTIR)
Topic: Math
Published: 11/24/2010
Authors: David E. Gilsinn, Kiran Bhadriraju, John T Elliott
Abstract: Biological cells are composed of many subsystems and organelles. The subsystem called the cytoskeleton is composed of long rod-shaped structures. They give the cell form and help attach the cell to the substrate and neighbors. One of the filaments is ...

27. Changes
Topic: Math
Published: 1/3/2011
Author: Isabel M Beichl

28. Channel Coding for Code Excited Linear Prediction (CELP) Encoded Speech in Mobile Radio Applications
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5503
Topic: Math
Published: 8/1/1994
Authors: Ehud Bracha, Nariman Farvardin, Y Yesha

29. Classical and Bayesian Interpretation of the Birge Test of Consistency and Its Generalized Version in Interlaboratory Evaluations
Topic: Math
Published: 4/10/2008
Authors: Raghu N Kacker, Alistair Forbes, Ruediger Kessel, K D Sommer
Abstract: The results from an interlaboratory evaluation are said to be consistent if their dispersion is not more than what can reasonably be attributed to their stated variances. A well known test of consistency in interlaboratory evaluations is the Birge te ...

30. Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples
Topic: Math
Published: 1/9/2014
Authors: Yu Lei, Raghu N Kacker
Abstract: A software product line is a set of software systems that share some common features. Several recent works have been reported that apply combinatorial testing, a very effective testing strategy to software product lines. A unique challenge in these w ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series