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Displaying records 111 to 120 of 231 records.
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111. Five Examples of Assessment and Expression of Measurement Uncertainty
Topic: Math
Published: 2/12/2013
Author: Antonio M Possolo
Abstract: It is a long accepted tenet of scientific practice that every measurement result ought to include a statement of uncertainty associated with the measured value, and that such uncertainty should be propagated to derivative products. It is also widely ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910812

112. Four Measures of Nonlinearity
Topic: Math
Published: 6/23/2013
Authors: Joan Boyar, Magnus Find, Rene C Peralta
Abstract: Cryptographic applications, such as hashing, block ciphers and stream ciphers, make use of functions which are simple by some criteria (such as circuit implementations), yet hard to invert almost everywhere. A necessary condition for the latter prope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913656

113. Fourier, Gauss, Fraunhofer, Porod and the Shape from Moments Problem
Topic: Math
Published: 1/17/2012
Author: Gregg M. Gallatin
Abstract: We show how the Fourier transform of a shape in any number of dimensions can be simplified using Gauss' law and evaluated explicitly for polygons in two dimensions, polyhedra three dimensions, etc. We also show how this combination of Fourier and Gau ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909668

114. Fourier, Gegenbauer and Jacobi expansions for a power-law fundamental solution of the polyharmonic equation and polyspherical addition theorems
Topic: Math
Published: 6/5/2013
Author: Howard S Cohl
Abstract: We develop complex Jacobi, Gegenbauer and Chebyshev polynomial expansions for the kernels associated with power-law fundamental solutions of the polyharmonic equation on d-dimensional Euclidean space. From these series representations we derive Fouri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912042

115. Front Matter for Special Issue of NIST Journal of Research in honor of Christoph Witzgall
Series: Journal of Research (NIST JRES)
Topic: Math
Published: 3/31/2006
Authors: David E. Gilsinn, Ronald F Boisvert
Abstract: This front matter for a special issue of the NIST Journal of Research contains a photograph and biography of Christoph Witzgall. It also contains a thank you paragraph by Christoph Witzgall for a symposium held in his honor. Many of the papers in thi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150660

116. Generation of Lattice Wannier Functions via Maximum Localization
Topic: Math
Published: 3/1/2005
Author: Eric J Cockayne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854239

117. Grain Size Distribution in Two Dimensions in the Long Time Limit
Topic: Math
Published: 7/8/2008
Authors: Geoffrey B McFadden, C.S. Pande, K.P. Cooper
Abstract: It is shown that the inclusion of a "noise" term in the growth rate of individual grains leads to a stochastic model that provides a more realistic description of grain growth phenomenon. The resulting Fokker-Planck equation for the grain s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=152126

118. HAZARDOUS CONTINUATION BACKWARD IN TIME IN NONLINEAR PARABOLIC EQUATIONS AND AN EXPERIMENT IN DEBLURRING NONLINEARLY BLURRED IMAGERY
Series: Journal of Research (NIST JRES)
Report Number: 118.010
Topic: Math
Published: 4/25/2013
Author: Alfred S Carasso
Abstract: Identifying sources of ground water pollution, and deblurring nanoscale imagery, as well as astronomical galaxy images, often involves the numerical computation of parabolic equations backward in time. However, very little computational experien ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912357

119. IPOG/IPOG-D: Efficient Test Generation for Multi-way Combinatorial Testing
Topic: Math
Published: 11/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: We present two strategies for multi-way testing (i.e., t-way testing with t > 2). The first strategy generalizes an existing strategy, called In-Parameter-Order, from pairwise testing to multi-way testing. This strategy requires all t-way combination ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50964

120. IPOG: A General Strategy for t-Way Software Testing
Topic: Math
Published: 3/29/2007
Authors: Yu Lei, Raghu N Kacker, David R Kuhn, Vadim Okun, James F Lawrence
Abstract: Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50944



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