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Author: simon kaplan
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Displaying records 41 to 50 of 73 records.
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41. Infrared Transmittance Standards-2053, 2054, 2055, and 2056
Published: 5/1/2001
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104522

42. Infrared diffuse reflectance instrumentation and standards at NIST
Published: 1/1/1999
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103848

43. Infrared regular reflectance and transmittance instrumentation and standards at NIST
Published: 1/1/1998
Authors: Simon Grant Kaplan, Leonard M Hanssen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103918

44. Intercomparison of Regular Spectral Transmittance and Reflectance Measurements with FTIR- and Monochromator-Based Spectrophotometers
Published: 10/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal
Abstract: We have performed regular spectral transmittance and reflectance measurements over the 1 mm to 2.5 mm wavelength region on several different types of materials using three different spectrophotometer systems. Two of the systems employ grating-based ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841485

45. Intercomparison of Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103912

46. Intercomparison of regular spectral transmittance and reflectance measurements with monochromator and FTIR based spectrophotometers
Published: 1/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103913

47. Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103844

48. Linearity Characterization of NIST's Infrared Spectral Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: System Linearity is a fundamental characterization performed on spectrophotometers. Yet it is one that is not adequately performed on Fourier transform instruments, because of the lack of a method for linearity characterization that will work suffici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841636

49. Measurement of the Far-infrared Magneto-conductivity Sensor of Superconducting YBa^d2^Cu^d3^O^d7^ Thin Films
Published: 1/1/1996
Authors: H-T S Lihn, S Wu, H D Drew, Simon Grant Kaplan, Q Li, D B Fenner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103973

50. Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K
Published: 9/1/2002
Authors: Simon Grant Kaplan, M E Thomas
Abstract: We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm^u-1^ 10000 cm^u-1^ wave number range and temperatures from 10 K to 295 K. The refractive index is determine ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841648



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