NIST logo

Publications Portal

You searched on:
Author: simon kaplan

Displaying records 11 to 20 of 77 records.
Resort by: Date / Title


11. High index optical materials for 193 nm immersion lithography
Published: 1/1/2006
Authors: Simon Grant Kaplan, J H Burnett, Eric L Shirley, D Horowitz, W Clauss, A Grenville, C Van peski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103909

12. Effect of Dissolved Air on the Density and Refractive Index of Water
Published: 9/30/2005
Authors: Allan H Harvey, Simon G. Kaplan, John H. Burnett
Abstract: We consider the effect of dissolved air on the density and the refractive index of liquid water from 0 ¿aC to 50 ¿aC. The density effect is calculated from the best available values of Henry's constants and partial molar volumes for the components of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50167

13. Effect of Dissolved Air on the Density and Refractive Index A. of Water
Published: 1/1/2005
Authors: H Harvey, Simon Grant Kaplan, John H. Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102135

14. High refractive index immersion fluids for 193 nm immersion lithography
Published: 1/1/2005
Authors: B Budhlall, G Parris, P Zhang, X Gao, Z Zarkov, B Ross, Simon Grant Kaplan, J Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101369

15. High-index materials for 193 nm immersion lithography
Published: 1/1/2005
Authors: J H Burnett, Simon Grant Kaplan, Eric L Shirley, P J Tompkins, J E Webb
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101372

16. Fluid refractive index measurements using roughened surface and prism minimum deviation techniques-
Published: 1/1/2004
Authors: R A Synowicki, G K Pribil, G Cooney, C M Herzinger, S E Green, Roger H French, Min K Yang, John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102555

17. Immersion Fluid Refractive Indices Using Prism Minimum Deviation Techniques, ed. by A. Yen
Published: 1/1/2004
Authors: Roger H French, Min K Yang, M F Lemon, R A Synowicki, G K Pribil, G Cooney, C M Herzinger, S E Green, John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102696

18. Measurement of the Refractive Index and Thermo-Optic Coefficient of Water Near 193 nm
Published: 1/1/2004
Authors: Simon Grant Kaplan, J H Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103910

19. Measurement of the refractive index and thermo-optic coefficient of water near 193 nm
Published: 1/1/2004
Authors: John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101993

20. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 11/1/2003
Authors: R Gupta, Simon Grant Kaplan
Abstract: We have constructed a new facility at the National Institute of Standrds and Technology to measure the index of refraction of transmissive materials in the wavelength range from the visible down to the vacuum ultraviolet (VUV). The interferometric t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841724



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series